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Article: Enhanced film quality of Y-Ba-Cu-O by using Eu-Cu-O buffer layer on Sr-Ti-O substrates

TitleEnhanced film quality of Y-Ba-Cu-O by using Eu-Cu-O buffer layer on Sr-Ti-O substrates
Authors
Issue Date2001
PublisherIEEE.
Citation
IEEE Transactions on Applied Superconductivity, 2001, v. 11 n. 1, p. 2723-2725 How to Cite?
AbstractEu2CuO4 (ECO) has been used as a buffer layer for growing of YBa2Cu3O7-δ (YBCO) thin films on SrTiO3 (STO) (100) substrates. The epitaxy, crystallinity and surface of YBCO thin films have been significantly improved by using ECO buffer layer as investigated by x-ray diffraction, rocking curves, scanning electron microscope, surface step profiler and x-ray small angle reflection. The best value of the full width at half maximum of the YBCO (005) peak can be greatly reduced down to less than 0.1 degree. The scanning electron microscope photos indicate very smooth surface for the YBCO thin films. The average roughness is less than 5 nm over a wide scanning region of 2000 μm. The results of x-ray small angle reflection indicate a very clear and flat interface between YBCO and ECO layers. Our results suggest that ECO should be a good barrier candidate for fabricating high-Tc superconductor junctions.
Persistent Identifierhttp://hdl.handle.net/10722/43318
ISSN
2015 Impact Factor: 1.092
2015 SCImago Journal Rankings: 0.381
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorTang, WHen_HK
dc.contributor.authorGao, Jen_HK
dc.date.accessioned2007-03-23T04:43:29Z-
dc.date.available2007-03-23T04:43:29Z-
dc.date.issued2001en_HK
dc.identifier.citationIEEE Transactions on Applied Superconductivity, 2001, v. 11 n. 1, p. 2723-2725en_HK
dc.identifier.issn1051-8223en_HK
dc.identifier.urihttp://hdl.handle.net/10722/43318-
dc.description.abstractEu2CuO4 (ECO) has been used as a buffer layer for growing of YBa2Cu3O7-δ (YBCO) thin films on SrTiO3 (STO) (100) substrates. The epitaxy, crystallinity and surface of YBCO thin films have been significantly improved by using ECO buffer layer as investigated by x-ray diffraction, rocking curves, scanning electron microscope, surface step profiler and x-ray small angle reflection. The best value of the full width at half maximum of the YBCO (005) peak can be greatly reduced down to less than 0.1 degree. The scanning electron microscope photos indicate very smooth surface for the YBCO thin films. The average roughness is less than 5 nm over a wide scanning region of 2000 μm. The results of x-ray small angle reflection indicate a very clear and flat interface between YBCO and ECO layers. Our results suggest that ECO should be a good barrier candidate for fabricating high-Tc superconductor junctions.en_HK
dc.format.extent447703 bytes-
dc.format.extent30720 bytes-
dc.format.extent514928 bytes-
dc.format.mimetypeapplication/pdf-
dc.format.mimetypeapplication/msword-
dc.format.mimetypeimage/jpeg-
dc.languageengen_HK
dc.publisherIEEE.en_HK
dc.rightsCreative Commons: Attribution 3.0 Hong Kong License-
dc.rights©2001 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.en_HK
dc.titleEnhanced film quality of Y-Ba-Cu-O by using Eu-Cu-O buffer layer on Sr-Ti-O substratesen_HK
dc.typeArticleen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=1051-8223&volume=11&issue=1&spage=2723&epage=2725&date=2001&atitle=Enhanced+film+quality+of+Y-Ba-Cu-O+by+using+Eu-Cu-O+buffer+layer+on+Sr-Ti-O+substratesen_HK
dc.description.naturepublished_or_final_versionen_HK
dc.identifier.doi10.1109/77.919625en_HK
dc.identifier.scopuseid_2-s2.0-0035268379-
dc.identifier.hkuros57677-
dc.identifier.isiWOS:000168285900010-

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