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Article: Thermal-diffusivity measurements of an oriented superconducting-film–substrate composite using the mirage technique

TitleThermal-diffusivity measurements of an oriented superconducting-film–substrate composite using the mirage technique
Authors
KeywordsPhysics
Issue Date1995
PublisherAmerican Physical Society. The Journal's web site is located at http://prb.aps.org/
Citation
Physical Review B (Condensed Matter), 1995, v. 51 n. 1, p. 523-533 How to Cite?
AbstractWhen one measures the thermal diffusivity χ of a thin film on a substrate by the mirage method, the photothermal deflection of the probe beam is caused by the heat field contributed by both the film and the substrate which are heated by the pump beam. To include the effects due to the presence of the substrate, we present a method to measure the diffusivities of both the film and substrate in one set of mirage detection. Using the off-axis magnetron sputtering process, we fabricated YBa2Cu3O7-δ thin films of suitable thickness (∼60 nm) on SrTiO3 as our sample for χ measurements along the c and b axes. Our results are consistent with published ones.
Persistent Identifierhttp://hdl.handle.net/10722/43233
ISSN
2001 Impact Factor: 3.07
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorWong, PKen_HK
dc.contributor.authorFung, PCWen_HK
dc.contributor.authorTam, HLen_HK
dc.contributor.authorGao, Jen_HK
dc.date.accessioned2007-03-23T04:41:50Z-
dc.date.available2007-03-23T04:41:50Z-
dc.date.issued1995en_HK
dc.identifier.citationPhysical Review B (Condensed Matter), 1995, v. 51 n. 1, p. 523-533en_HK
dc.identifier.issn0163-1829en_HK
dc.identifier.urihttp://hdl.handle.net/10722/43233-
dc.description.abstractWhen one measures the thermal diffusivity χ of a thin film on a substrate by the mirage method, the photothermal deflection of the probe beam is caused by the heat field contributed by both the film and the substrate which are heated by the pump beam. To include the effects due to the presence of the substrate, we present a method to measure the diffusivities of both the film and substrate in one set of mirage detection. Using the off-axis magnetron sputtering process, we fabricated YBa2Cu3O7-δ thin films of suitable thickness (∼60 nm) on SrTiO3 as our sample for χ measurements along the c and b axes. Our results are consistent with published ones.en_HK
dc.format.extent1498758 bytes-
dc.format.extent30720 bytes-
dc.format.mimetypeapplication/pdf-
dc.format.mimetypeapplication/msword-
dc.languageengen_HK
dc.publisherAmerican Physical Society. The Journal's web site is located at http://prb.aps.org/en_HK
dc.rightsCreative Commons: Attribution 3.0 Hong Kong License-
dc.rightsPhysical Review B (Condensed Matter). Copyright © American Physical Society.en_HK
dc.subjectPhysicsen_HK
dc.titleThermal-diffusivity measurements of an oriented superconducting-film–substrate composite using the mirage techniqueen_HK
dc.typeArticleen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0163-1829&volume=51&issue=1&spage=523&epage=533&date=1995&atitle=Thermal-diffusivity+measurements+of+an+oriented+superconducting-film–substrate+composite+using+the+mirage+techniqueen_HK
dc.description.naturepublished_or_final_versionen_HK
dc.identifier.doi10.1103/PhysRevB.51.523en_HK
dc.identifier.scopuseid_2-s2.0-0039243613-
dc.identifier.isiWOS:A1995QB37700063-

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