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Article: Electroabsorption enhancement in disordered, strained InGaAs/GaAs quantum well
Title | Electroabsorption enhancement in disordered, strained InGaAs/GaAs quantum well |
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Authors | |
Keywords | Physics engineering |
Issue Date | 1995 |
Publisher | American Institute of Physics. The Journal's web site is located at http://apl.aip.org/ |
Citation | Applied Physics Letters, 1995, v. 67 n. 19, p. 2768-2770 How to Cite? |
Abstract | The results of modeling the application of an external electric field to disordered, strained InGaAs/GaAs single quantum well are presented. An error function profile is used to model the constituent atoms composition after interdiffusion. Results indicate that the exciton Stark shift in the disordered quantum well is greater than in the as-grown 10 nm wide In0.2Ga0.8As well, and that the change in electroabsorption near the fundamental exciton absorption peak is enhanced by 30% in the disordered quantum well for a 30 kV/cm electric field applied perpendicular to the well. These results may be used to achieve optical modulators with improved performance characteristics in strained quantum well structures. © 1995 American Institute of Physics. |
Persistent Identifier | http://hdl.handle.net/10722/42980 |
ISSN | 2023 Impact Factor: 3.5 2023 SCImago Journal Rankings: 0.976 |
ISI Accession Number ID |
DC Field | Value | Language |
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dc.contributor.author | Micallef, J | en_HK |
dc.contributor.author | Li, EH | en_HK |
dc.contributor.author | Weiss, BL | en_HK |
dc.date.accessioned | 2007-03-23T04:35:57Z | - |
dc.date.available | 2007-03-23T04:35:57Z | - |
dc.date.issued | 1995 | en_HK |
dc.identifier.citation | Applied Physics Letters, 1995, v. 67 n. 19, p. 2768-2770 | - |
dc.identifier.issn | 0003-6951 | en_HK |
dc.identifier.uri | http://hdl.handle.net/10722/42980 | - |
dc.description.abstract | The results of modeling the application of an external electric field to disordered, strained InGaAs/GaAs single quantum well are presented. An error function profile is used to model the constituent atoms composition after interdiffusion. Results indicate that the exciton Stark shift in the disordered quantum well is greater than in the as-grown 10 nm wide In0.2Ga0.8As well, and that the change in electroabsorption near the fundamental exciton absorption peak is enhanced by 30% in the disordered quantum well for a 30 kV/cm electric field applied perpendicular to the well. These results may be used to achieve optical modulators with improved performance characteristics in strained quantum well structures. © 1995 American Institute of Physics. | en_HK |
dc.format.extent | 76888 bytes | - |
dc.format.extent | 31232 bytes | - |
dc.format.mimetype | application/pdf | - |
dc.format.mimetype | application/msword | - |
dc.language | eng | en_HK |
dc.publisher | American Institute of Physics. The Journal's web site is located at http://apl.aip.org/ | en_HK |
dc.relation.ispartof | Applied Physics Letters | - |
dc.rights | Copyright 1995 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Applied Physics Letters, 1995, v. 67 n. 19, p. 2768-2770 and may be found at https://doi.org/10.1063/1.114587 | - |
dc.subject | Physics engineering | en_HK |
dc.title | Electroabsorption enhancement in disordered, strained InGaAs/GaAs quantum well | en_HK |
dc.type | Article | en_HK |
dc.identifier.openurl | http://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0003-6951&volume=67&issue=19&spage=2768&epage=2770&date=1995&atitle=Electroabsorption+enhancement+in+disordered,+strained+InGaAs/GaAs+quantum+well | en_HK |
dc.description.nature | published_or_final_version | en_HK |
dc.identifier.doi | 10.1063/1.114587 | - |
dc.identifier.scopus | eid_2-s2.0-0029638097 | - |
dc.identifier.hkuros | 9345 | - |
dc.identifier.volume | 67 | - |
dc.identifier.issue | 19 | - |
dc.identifier.spage | 2768 | - |
dc.identifier.epage | 2770 | - |
dc.identifier.isi | WOS:A1995TC98500006 | - |
dc.identifier.issnl | 0003-6951 | - |