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Article: Discriminative fabric defect detection using adaptive wavelets
Title | Discriminative fabric defect detection using adaptive wavelets |
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Authors | |
Keywords | Adaptive wavelets Defect detection Discriminative feature extraction Undecimated discrete wavelet transform |
Issue Date | 2002 |
Publisher | S P I E - International Society for Optical Engineering. The Journal's web site is located at http://www.spie.org/oe |
Citation | Optical Engineering, 2002, v. 41 n. 12, p. 3116-3126 How to Cite? |
Abstract | We propose a new method for fabric defect detection by incorporating the design of an adaptive wavelet-based feature extractor with the design of an Euclidean distance-based detector. The proposed method characterizes the fabric image with multiscale wavelet features by using undecimated discrete wavelet transforms. Each nonoverlapping window of the fabric image is then detected as defect or nondefect with an Euclidean distance-based detector. Instead of using the standard wavelet bases, an adaptive wavelet basis is designed for the detection of fabric defects. Minimization of the detection error Is achieved by incorporating the design of the adaptive wavelet with the design of the detector parameters using a discriminative feature extraction (DFE) training method. The proposed method has been evaluated on 480 defect samples from five types of defects, and 480 nondefect samples, where a 97.5% detection rate and 0.63% false alarm rate were achieved. The evaluations were also carried out on unknown types of defects, where a 93.3% detection rate and 3.97% false alarm rate were achieved in the detection of 180 defect samples and 780 nondefect samples. © 2002 Society of Photo-Optical Instrumentation Engineers. |
Persistent Identifier | http://hdl.handle.net/10722/42921 |
ISSN | 2023 Impact Factor: 1.1 2023 SCImago Journal Rankings: 0.331 |
ISI Accession Number ID | |
References |
DC Field | Value | Language |
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dc.contributor.author | Yang, XZ | en_HK |
dc.contributor.author | Pang, GKH | en_HK |
dc.contributor.author | Yung, NHC | en_HK |
dc.date.accessioned | 2007-03-23T04:34:46Z | - |
dc.date.available | 2007-03-23T04:34:46Z | - |
dc.date.issued | 2002 | en_HK |
dc.identifier.citation | Optical Engineering, 2002, v. 41 n. 12, p. 3116-3126 | en_HK |
dc.identifier.issn | 0091-3286 | en_HK |
dc.identifier.uri | http://hdl.handle.net/10722/42921 | - |
dc.description.abstract | We propose a new method for fabric defect detection by incorporating the design of an adaptive wavelet-based feature extractor with the design of an Euclidean distance-based detector. The proposed method characterizes the fabric image with multiscale wavelet features by using undecimated discrete wavelet transforms. Each nonoverlapping window of the fabric image is then detected as defect or nondefect with an Euclidean distance-based detector. Instead of using the standard wavelet bases, an adaptive wavelet basis is designed for the detection of fabric defects. Minimization of the detection error Is achieved by incorporating the design of the adaptive wavelet with the design of the detector parameters using a discriminative feature extraction (DFE) training method. The proposed method has been evaluated on 480 defect samples from five types of defects, and 480 nondefect samples, where a 97.5% detection rate and 0.63% false alarm rate were achieved. The evaluations were also carried out on unknown types of defects, where a 93.3% detection rate and 3.97% false alarm rate were achieved in the detection of 180 defect samples and 780 nondefect samples. © 2002 Society of Photo-Optical Instrumentation Engineers. | en_HK |
dc.format.extent | 472804 bytes | - |
dc.format.extent | 28160 bytes | - |
dc.format.extent | 961133 bytes | - |
dc.format.extent | 5183 bytes | - |
dc.format.mimetype | application/pdf | - |
dc.format.mimetype | application/msword | - |
dc.format.mimetype | application/pdf | - |
dc.format.mimetype | text/plain | - |
dc.language | eng | en_HK |
dc.publisher | S P I E - International Society for Optical Engineering. The Journal's web site is located at http://www.spie.org/oe | en_HK |
dc.relation.ispartof | Optical Engineering | en_HK |
dc.rights | Copyright 2002 Society of Photo‑Optical Instrumentation Engineers (SPIE). One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this publication for a fee or for commercial purposes, and modification of the contents of the publication are prohibited. This article is available online at https://doi.org/10.1117/1.1517290 | - |
dc.subject | Adaptive wavelets | en_HK |
dc.subject | Defect detection | en_HK |
dc.subject | Discriminative feature extraction | en_HK |
dc.subject | Undecimated discrete wavelet transform | en_HK |
dc.title | Discriminative fabric defect detection using adaptive wavelets | en_HK |
dc.type | Article | en_HK |
dc.identifier.openurl | http://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0091-3286&volume=41&issue=12&spage=3116&epage=3125&date=2002&atitle=Discriminative+fabric+defect+detection+using+adaptive+wavelets | en_HK |
dc.identifier.email | Pang, GKH:gpang@eee.hku.hk | en_HK |
dc.identifier.email | Yung, NHC:nyung@eee.hku.hk | en_HK |
dc.identifier.authority | Pang, GKH=rp00162 | en_HK |
dc.identifier.authority | Yung, NHC=rp00226 | en_HK |
dc.description.nature | published_or_final_version | en_HK |
dc.identifier.doi | 10.1117/1.1517290 | en_HK |
dc.identifier.scopus | eid_2-s2.0-0036980303 | en_HK |
dc.identifier.hkuros | 81196 | - |
dc.relation.references | http://www.scopus.com/mlt/select.url?eid=2-s2.0-0036980303&selection=ref&src=s&origin=recordpage | en_HK |
dc.identifier.volume | 41 | en_HK |
dc.identifier.issue | 12 | en_HK |
dc.identifier.spage | 3116 | en_HK |
dc.identifier.epage | 3126 | en_HK |
dc.identifier.isi | WOS:000179954500018 | - |
dc.publisher.place | United States | en_HK |
dc.identifier.scopusauthorid | Yang, XZ=7406505132 | en_HK |
dc.identifier.scopusauthorid | Pang, GKH=7103393283 | en_HK |
dc.identifier.scopusauthorid | Yung, NHC=7003473369 | en_HK |
dc.identifier.issnl | 0091-3286 | - |