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Article: The effect of growth interruption on the properties of InGaAs/InAlAs quantum well structures
Title | The effect of growth interruption on the properties of InGaAs/InAlAs quantum well structures |
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Authors | |
Keywords | Physics engineering |
Issue Date | 1998 |
Publisher | American Institute of Physics. The Journal's web site is located at http://apl.aip.org/ |
Citation | Applied Physics Letters, 1998, v. 72 n. 3, p. 338-340 How to Cite? |
Abstract | The effect of the growth interruption time during the growth of InGaAs/InAlAs quantum well structures is shown to have a significant effect on both the interband transitions, as determined by photoreflectance, and the electrical properties of the as-grown structure. The results show that, for increasing growth interruption time, the quantum well heterointerfaces become more abrupt and the carrier mobility increases, thereby demonstrating that long interruption times are preferable for the growth of high quality rectangular quantum well structures. © 1998 American Institute of Physics. |
Persistent Identifier | http://hdl.handle.net/10722/42782 |
ISSN | 2023 Impact Factor: 3.5 2023 SCImago Journal Rankings: 0.976 |
ISI Accession Number ID | |
References |
DC Field | Value | Language |
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dc.contributor.author | Choy, WCH | en_HK |
dc.contributor.author | Hughes, PJ | en_HK |
dc.contributor.author | Weiss, BL | en_HK |
dc.contributor.author | Li, EH | en_HK |
dc.contributor.author | Hong, K | en_HK |
dc.contributor.author | Pavlidis, D | en_HK |
dc.date.accessioned | 2007-03-23T04:32:05Z | - |
dc.date.available | 2007-03-23T04:32:05Z | - |
dc.date.issued | 1998 | en_HK |
dc.identifier.citation | Applied Physics Letters, 1998, v. 72 n. 3, p. 338-340 | - |
dc.identifier.issn | 0003-6951 | en_HK |
dc.identifier.uri | http://hdl.handle.net/10722/42782 | - |
dc.description.abstract | The effect of the growth interruption time during the growth of InGaAs/InAlAs quantum well structures is shown to have a significant effect on both the interband transitions, as determined by photoreflectance, and the electrical properties of the as-grown structure. The results show that, for increasing growth interruption time, the quantum well heterointerfaces become more abrupt and the carrier mobility increases, thereby demonstrating that long interruption times are preferable for the growth of high quality rectangular quantum well structures. © 1998 American Institute of Physics. | en_HK |
dc.format.extent | 71670 bytes | - |
dc.format.extent | 31232 bytes | - |
dc.format.mimetype | application/pdf | - |
dc.format.mimetype | application/msword | - |
dc.language | eng | en_HK |
dc.publisher | American Institute of Physics. The Journal's web site is located at http://apl.aip.org/ | en_HK |
dc.relation.ispartof | Applied Physics Letters | en_HK |
dc.rights | Copyright 1998 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Applied Physics Letters, 1998, v. 72 n. 3, p. 338-340 and may be found at https://doi.org/10.1063/1.120729 | - |
dc.subject | Physics engineering | en_HK |
dc.title | The effect of growth interruption on the properties of InGaAs/InAlAs quantum well structures | en_HK |
dc.type | Article | en_HK |
dc.identifier.openurl | http://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0003-6951&volume=72&issue=3&spage=338&epage=340&date=1998&atitle=The+effect+of+growth+interruption+on+the+properties+of+InGaAs/InAlAs+quantum+well+structures | en_HK |
dc.identifier.email | Choy, WCH:chchoy@eee.hku.hk | en_HK |
dc.identifier.authority | Choy, WCH=rp00218 | en_HK |
dc.description.nature | published_or_final_version | en_HK |
dc.identifier.doi | 10.1063/1.120729 | en_HK |
dc.identifier.scopus | eid_2-s2.0-0031676734 | en_HK |
dc.identifier.hkuros | 38022 | - |
dc.relation.references | http://www.scopus.com/mlt/select.url?eid=2-s2.0-0031676734&selection=ref&src=s&origin=recordpage | en_HK |
dc.identifier.volume | 72 | en_HK |
dc.identifier.issue | 3 | en_HK |
dc.identifier.spage | 338 | en_HK |
dc.identifier.epage | 340 | en_HK |
dc.identifier.isi | WOS:000071558100024 | - |
dc.publisher.place | United States | en_HK |
dc.identifier.scopusauthorid | Choy, WCH=7006202371 | en_HK |
dc.identifier.scopusauthorid | Hughes, PJ=36347155300 | en_HK |
dc.identifier.scopusauthorid | Weiss, BL=7402309717 | en_HK |
dc.identifier.scopusauthorid | Li, EH=7201410087 | en_HK |
dc.identifier.scopusauthorid | Hong, K=7402515563 | en_HK |
dc.identifier.scopusauthorid | Pavlidis, D=7004537136 | en_HK |
dc.identifier.issnl | 0003-6951 | - |