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Article: Microstructures and resistivity of cuprate/manganite bilayer deposited on SrTiO3 substrate

TitleMicrostructures and resistivity of cuprate/manganite bilayer deposited on SrTiO3 substrate
Authors
KeywordsPhysics engineering
Issue Date2003
PublisherAmerican Institute of Physics. The Journal's web site is located at http://jap.aip.org/jap/staff.jsp
Citation
Journal of Applied Physics, 2003, v. 93 n. 10, p. 8215-8217 How to Cite?
AbstractThin Yba[SUB2]Cu[SUB3]O[SUB7-δ/La[SUB0.67]Ca[SUB0.33]MnO[SUB3] (YBCO/LCMO) films were grown on SrTiO[SUB3](STO)substrates by magnetron sputtering technique. The microstructures of the bilayers were characterized and a standard four-probe technique was applied to measure the resistivity of the samples. The interdiffusions at the YBCO/LCMO and LCMO/STO interfaces formed two transient layers with the thickness of about 3 and 2 nm, respectively. All the bilayers were well textured along the c axis. At low temperature, the superconductivity can only be observed when the thickness of YBCO is more than 25 nm. When the thickness of YBCO is less than 8 nm, the bilayers show only ferromagnetism. The superconductivity and ferromagnetism perhaps coexist in the bilayer with the YBCO thickness of 12.5 nm. These interesting properties are related to the interaction between spin polarized electrons in the manganites and the cooper pairs in the cuprates. © 2003 American Institute of Physics.
Persistent Identifierhttp://hdl.handle.net/10722/42481
ISSN
2015 Impact Factor: 2.101
2015 SCImago Journal Rankings: 0.603
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorTan, WSen_HK
dc.contributor.authorWu, XSen_HK
dc.contributor.authorDu, Jen_HK
dc.contributor.authorLiu, JSen_HK
dc.contributor.authorHu, Aen_HK
dc.contributor.authorJiang, SSen_HK
dc.contributor.authorWang, Jen_HK
dc.contributor.authorWu, ZHen_HK
dc.contributor.authorZheng, WLen_HK
dc.contributor.authorJia, QJen_HK
dc.contributor.authorGao, Jen_HK
dc.date.accessioned2007-01-29T08:50:52Z-
dc.date.available2007-01-29T08:50:52Z-
dc.date.issued2003en_HK
dc.identifier.citationJournal of Applied Physics, 2003, v. 93 n. 10, p. 8215-8217en_HK
dc.identifier.issn0021-8979en_HK
dc.identifier.urihttp://hdl.handle.net/10722/42481-
dc.description.abstractThin Yba[SUB2]Cu[SUB3]O[SUB7-δ/La[SUB0.67]Ca[SUB0.33]MnO[SUB3] (YBCO/LCMO) films were grown on SrTiO[SUB3](STO)substrates by magnetron sputtering technique. The microstructures of the bilayers were characterized and a standard four-probe technique was applied to measure the resistivity of the samples. The interdiffusions at the YBCO/LCMO and LCMO/STO interfaces formed two transient layers with the thickness of about 3 and 2 nm, respectively. All the bilayers were well textured along the c axis. At low temperature, the superconductivity can only be observed when the thickness of YBCO is more than 25 nm. When the thickness of YBCO is less than 8 nm, the bilayers show only ferromagnetism. The superconductivity and ferromagnetism perhaps coexist in the bilayer with the YBCO thickness of 12.5 nm. These interesting properties are related to the interaction between spin polarized electrons in the manganites and the cooper pairs in the cuprates. © 2003 American Institute of Physics.en_HK
dc.format.extent61981 bytes-
dc.format.extent28672 bytes-
dc.format.mimetypeapplication/pdf-
dc.format.mimetypeapplication/msword-
dc.languageengen_HK
dc.publisherAmerican Institute of Physics. The Journal's web site is located at http://jap.aip.org/jap/staff.jspen_HK
dc.rightsCreative Commons: Attribution 3.0 Hong Kong License-
dc.subjectPhysics engineeringen_HK
dc.titleMicrostructures and resistivity of cuprate/manganite bilayer deposited on SrTiO3 substrateen_HK
dc.typeArticleen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0021-8979&volume=93&issue=10&spage=8215&epage=8217&date=2003&atitle=Microstructures+and+resistivity+of+cuprate/manganite+bilayer+deposited+on+SrTiO3+substrateen_HK
dc.description.naturepublished_or_final_versionen_HK
dc.identifier.doi10.1063/1.1541653en_HK
dc.identifier.scopuseid_2-s2.0-0037979235-
dc.identifier.hkuros77174-
dc.identifier.isiWOS:000182822600192-

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