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Article: 360-deg profilometry: new techniques for display and acquisition
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Title360-deg profilometry: new techniques for display and acquisition
 
AuthorsAsundi, A
Chan, CS
Sajan, MR1
 
KeywordsProfiometry
Logical moire
Phase shifting
Scanning moire structured light
Projected gratings
 
Issue Date1994
 
PublisherS P I E - International Society for Optical Engineering. The Journal's web site is located at http://www.spie.org/oe
 
CitationOptical Engineering, 1994, v. 33 n. 8, p. 2760-2769 [How to Cite?]
DOI: http://dx.doi.org/10.1117/12.176507
 
AbstractTwo optical methods are proposed for shape measurement and defect detection of curved surfaces in the form of a complete 360- deg profile of the object. The first one is the standard structured light approach. Display of the resulting data is the emphasis of this section. The second approach uses modulated structured light with a scanning digital camera for faster and simpler data acquisition. Quantitative processing is done off-line while real-time moire produces enhanced display of the defects for qualitative analysis.
 
ISSN0091-3286
2013 Impact Factor: 0.958
2013 SCImago Journal Rankings: 0.482
 
DOIhttp://dx.doi.org/10.1117/12.176507
 
ISI Accession Number IDWOS:A1994PB29900039
 
DC FieldValue
dc.contributor.authorAsundi, A
 
dc.contributor.authorChan, CS
 
dc.contributor.authorSajan, MR
 
dc.date.accessioned2007-01-29T08:49:05Z
 
dc.date.available2007-01-29T08:49:05Z
 
dc.date.issued1994
 
dc.description.abstractTwo optical methods are proposed for shape measurement and defect detection of curved surfaces in the form of a complete 360- deg profile of the object. The first one is the standard structured light approach. Display of the resulting data is the emphasis of this section. The second approach uses modulated structured light with a scanning digital camera for faster and simpler data acquisition. Quantitative processing is done off-line while real-time moire produces enhanced display of the defects for qualitative analysis.
 
dc.description.naturepublished_or_final_version
 
dc.format.extent1102314 bytes
 
dc.format.extent25088 bytes
 
dc.format.mimetypeapplication/pdf
 
dc.format.mimetypeapplication/msword
 
dc.identifier.citationOptical Engineering, 1994, v. 33 n. 8, p. 2760-2769 [How to Cite?]
DOI: http://dx.doi.org/10.1117/12.176507
 
dc.identifier.doihttp://dx.doi.org/10.1117/12.176507
 
dc.identifier.hkuros2133
 
dc.identifier.isiWOS:A1994PB29900039
 
dc.identifier.issn0091-3286
2013 Impact Factor: 0.958
2013 SCImago Journal Rankings: 0.482
 
dc.identifier.openurl
 
dc.identifier.scopuseid_2-s2.0-0028493516
 
dc.identifier.urihttp://hdl.handle.net/10722/42403
 
dc.languageeng
 
dc.publisherS P I E - International Society for Optical Engineering. The Journal's web site is located at http://www.spie.org/oe
 
dc.rightsCreative Commons: Attribution 3.0 Hong Kong License
 
dc.rightsCopyright 1994 Society of Photo-Optical Instrumentation Engineers. This paper was published in Optical Engineering and is made available as an electronic reprint with permission of SPIE. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.
 
dc.subjectProfiometry
 
dc.subjectLogical moire
 
dc.subjectPhase shifting
 
dc.subjectScanning moire structured light
 
dc.subjectProjected gratings
 
dc.title360-deg profilometry: new techniques for display and acquisition
 
dc.typeArticle
 
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Author Affiliations
  1. The University of Hong Kong