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Article: Change of the emission spectra in organic light-emitting diodes by layer thickness modification

TitleChange of the emission spectra in organic light-emitting diodes by layer thickness modification
Authors
Cheung, CHDjurišić, ABKwong, CYTam, HLCheah, KWLiu, ZTChan, WKChui, PCChan, JRakić, AD
KeywordsPhysics engineering
Issue Date2004
PublisherAmerican Institute of Physics. The Journal's web site is located at http://apl.aip.org/
Citation
Applied Physics Letters, 2004, v. 85 n. 14, p. 2944-2946 How to Cite?
DOI: http://dx.doi.org/10.1063/1.1802386
AbstractThe electroluminescence (EL) and photoluminescence properties of organic light-emitting diodes (LED) were analyzed using layer thickness modification. Investigations show that the EL spectra exhibited significant variation with the increase of the viewing angle. It was found that multiple peak emission could be achieved for a certain range of thickness values. It was concluded that near white emission with CIE coordinates (0.32, 0.43) could be obtained for optimized device thickness.
Persistent Identifierhttp://hdl.handle.net/10722/42363
ISSN
0003-6951
2023 Impact Factor: 3.5
2023 SCImago Journal Rankings: 0.976
ISI Accession Number ID
WOS:000224547300090
References
References in Scopus

 

DC FieldValueLanguage
dc.contributor.authorCheung, CHen_HK
dc.contributor.authorDjurišić, ABen_HK
dc.contributor.authorKwong, CYen_HK
dc.contributor.authorTam, HLen_HK
dc.contributor.authorCheah, KWen_HK
dc.contributor.authorLiu, ZTen_HK
dc.contributor.authorChan, WKen_HK
dc.contributor.authorChui, PCen_HK
dc.contributor.authorChan, Jen_HK
dc.contributor.authorRakić, ADen_HK
dc.date.accessioned2007-01-29T08:47:47Z-
dc.date.available2007-01-29T08:47:47Z-
dc.date.issued2004en_HK
dc.identifier.citationApplied Physics Letters, 2004, v. 85 n. 14, p. 2944-2946-
dc.identifier.issn0003-6951en_HK
dc.identifier.urihttp://hdl.handle.net/10722/42363-
dc.description.abstractThe electroluminescence (EL) and photoluminescence properties of organic light-emitting diodes (LED) were analyzed using layer thickness modification. Investigations show that the EL spectra exhibited significant variation with the increase of the viewing angle. It was found that multiple peak emission could be achieved for a certain range of thickness values. It was concluded that near white emission with CIE coordinates (0.32, 0.43) could be obtained for optimized device thickness.en_HK
dc.format.extent79360 bytes-
dc.format.extent28672 bytes-
dc.format.mimetypeapplication/pdf-
dc.format.mimetypeapplication/msword-
dc.languageengen_HK
dc.publisherAmerican Institute of Physics. The Journal's web site is located at http://apl.aip.org/en_HK
dc.relation.ispartofApplied Physics Lettersen_HK
dc.rightsCopyright 2004 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Applied Physics Letters, 2004, v. 85 n. 14, p. 2944-2946 and may be found at https://doi.org/10.1063/1.1802386-
dc.subjectPhysics engineeringen_HK
dc.titleChange of the emission spectra in organic light-emitting diodes by layer thickness modificationen_HK
dc.typeArticleen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0003-6951&volume=85&issue=14&spage=2944&epage=2946&date=2004&atitle=Change+of+the+emission+spectra+in+organic+light-emitting+diodes+by+layer+thickness+modificationen_HK
dc.identifier.emailDjurišić, AB: dalek@hku.hken_HK
dc.identifier.emailChan, WK: waichan@hku.hken_HK
dc.identifier.emailChui, PC: pcchui@hkucc.hku.hken_HK
dc.identifier.authorityDjurišić, AB=rp00690en_HK
dc.identifier.authorityChan, WK=rp00667en_HK
dc.identifier.authorityChui, PC=rp00114en_HK
dc.description.naturepublished_or_final_versionen_HK
dc.identifier.doi10.1063/1.1802386en_HK
dc.identifier.scopuseid_2-s2.0-8344286388en_HK
dc.identifier.hkuros96346-
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-8344286388&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume85en_HK
dc.identifier.issue14en_HK
dc.identifier.spage2944en_HK
dc.identifier.epage2946en_HK
dc.identifier.isiWOS:000224547300090-
dc.publisher.placeUnited Statesen_HK
dc.identifier.scopusauthoridCheung, CH=8618960900en_HK
dc.identifier.scopusauthoridDjurišić, AB=7004904830en_HK
dc.identifier.scopusauthoridKwong, CY=35917741900en_HK
dc.identifier.scopusauthoridTam, HL=7101835048en_HK
dc.identifier.scopusauthoridCheah, KW=7102792922en_HK
dc.identifier.scopusauthoridLiu, ZT=22934686400en_HK
dc.identifier.scopusauthoridChan, WK=13310083000en_HK
dc.identifier.scopusauthoridChui, PC=13309913400en_HK
dc.identifier.scopusauthoridChan, J=9234340000en_HK
dc.identifier.scopusauthoridRakić, AD=35618124100en_HK
dc.identifier.issnl0003-6951-

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