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Article: Experimental study and modeling of the influence of screw dislocations on the performance of Au/n-GaN Schottky diodes
Title | Experimental study and modeling of the influence of screw dislocations on the performance of Au/n-GaN Schottky diodes |
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Authors | |
Keywords | Physics engineering |
Issue Date | 2003 |
Publisher | American Institute of Physics. The Journal's web site is located at http://jap.aip.org/jap/staff.jsp |
Citation | Journal of Applied Physics, 2003, v. 94 n. 9, p. 5771-5775 How to Cite? |
Abstract | The influence of screw dislocations on the performance of Au/n-GaN Schottky diodes was investigated. The current-voltage (I-V) characteristics of the diodes fabricated on different GaN templates grown by metallorganic chemical vapor deposition on sapphire substrates were studied. It was shown that these dislocations result in the lowering of the barrier height in the localized regions. |
Persistent Identifier | http://hdl.handle.net/10722/42219 |
ISSN | 2023 Impact Factor: 2.7 2023 SCImago Journal Rankings: 0.649 |
ISI Accession Number ID | |
References |
DC Field | Value | Language |
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dc.contributor.author | Huang, Y | en_HK |
dc.contributor.author | Chen, XD | en_HK |
dc.contributor.author | Fung, S | en_HK |
dc.contributor.author | Beling, CD | en_HK |
dc.contributor.author | Ling, CC | en_HK |
dc.date.accessioned | 2007-01-08T02:31:51Z | - |
dc.date.available | 2007-01-08T02:31:51Z | - |
dc.date.issued | 2003 | en_HK |
dc.identifier.citation | Journal of Applied Physics, 2003, v. 94 n. 9, p. 5771-5775 | - |
dc.identifier.issn | 0021-8979 | en_HK |
dc.identifier.uri | http://hdl.handle.net/10722/42219 | - |
dc.description.abstract | The influence of screw dislocations on the performance of Au/n-GaN Schottky diodes was investigated. The current-voltage (I-V) characteristics of the diodes fabricated on different GaN templates grown by metallorganic chemical vapor deposition on sapphire substrates were studied. It was shown that these dislocations result in the lowering of the barrier height in the localized regions. | en_HK |
dc.format.extent | 108235 bytes | - |
dc.format.extent | 9781 bytes | - |
dc.format.mimetype | application/pdf | - |
dc.format.mimetype | text/plain | - |
dc.language | eng | en_HK |
dc.publisher | American Institute of Physics. The Journal's web site is located at http://jap.aip.org/jap/staff.jsp | en_HK |
dc.relation.ispartof | Journal of Applied Physics | en_HK |
dc.rights | Copyright 2003 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Journal of Applied Physics, 2003, v. 94 n. 9, p. 5771-5775 and may be found at https://doi.org/10.1063/1.1615705 | - |
dc.subject | Physics engineering | en_HK |
dc.title | Experimental study and modeling of the influence of screw dislocations on the performance of Au/n-GaN Schottky diodes | en_HK |
dc.type | Article | en_HK |
dc.identifier.openurl | http://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0021-8979&volume=94&issue=9&spage=5771&epage=5775&date=2003&atitle=Experimental+study+and+modeling+of+the+influence+of+screw+dislocations+on+the+performance+of+Au/n-GaN+Schottky+diodes | en_HK |
dc.identifier.email | Fung, S: sfung@hku.hk | en_HK |
dc.identifier.email | Beling, CD: cdbeling@hkucc.hku.hk | en_HK |
dc.identifier.email | Ling, CC: ccling@hkucc.hku.hk | en_HK |
dc.identifier.authority | Fung, S=rp00695 | en_HK |
dc.identifier.authority | Beling, CD=rp00660 | en_HK |
dc.identifier.authority | Ling, CC=rp00747 | en_HK |
dc.description.nature | published_or_final_version | en_HK |
dc.identifier.doi | 10.1063/1.1615705 | en_HK |
dc.identifier.scopus | eid_2-s2.0-0242468551 | en_HK |
dc.identifier.hkuros | 84964 | - |
dc.relation.references | http://www.scopus.com/mlt/select.url?eid=2-s2.0-0242468551&selection=ref&src=s&origin=recordpage | en_HK |
dc.identifier.volume | 94 | en_HK |
dc.identifier.issue | 9 | en_HK |
dc.identifier.spage | 5771 | en_HK |
dc.identifier.epage | 5775 | en_HK |
dc.identifier.isi | WOS:000186138600047 | - |
dc.publisher.place | United States | en_HK |
dc.identifier.scopusauthorid | Huang, Y=26643004400 | en_HK |
dc.identifier.scopusauthorid | Chen, XD=26642908200 | en_HK |
dc.identifier.scopusauthorid | Fung, S=7201970040 | en_HK |
dc.identifier.scopusauthorid | Beling, CD=7005864180 | en_HK |
dc.identifier.scopusauthorid | Ling, CC=13310239300 | en_HK |
dc.identifier.issnl | 0021-8979 | - |