Article: Photoinduced Dehydrogenation of Defects in Undoped a-Si:H Using Positron Annihilation Spectroscopy
| Title | Photoinduced Dehydrogenation of Defects in Undoped a-Si:H Using Positron Annihilation Spectroscopy |
|---|---|
| Authors | Zou, X3 Chan, YC3 Webb, DP3 Lam, YW3 Hu, YF1 Beling, CD1 Fung, S1 Weng, HM2 |
| Keywords | Physics |
| Issue Date | 2000 |
| Publisher | American Physical Society. The Journal's web site is located at http://prl.aps.org |
| Citation | Physical Review Letters, 2000, v. 84 n. 4, p. 769-772 [How to Cite?] DOI: http://dx.doi.org/10.1103/PhysRevLett.84.769 |
| Abstract | We report changes in variable-energy positron annihilation spectroscopy measurements on undoped hydrogenated amorphous silicon films after light soaking. The change, seen predominantly in the high momentum band of the annihilation radiation, is not reversed by thermal annealing. We suggest, following recent models of the Staebler-Wronski effect, that light exposure induces hydrogen trapped in vacancylikc detects to become mobile in the Si network. The observations place constraints on models of hydrogen motion fitting macroscopic Staebler-Wronski effect kinetics and may help to achieve a definitive description of metastability in a-Si:H. |
| ISSN | 0031-9007 2011 Impact Factor: 7.37 2011 SCImago Journal Rankings: 0.633 |
| DOI | http://dx.doi.org/10.1103/PhysRevLett.84.769 |
| ISI Accession Number ID | WOS:000084891700048 |
| References | References in Scopus |
| dc.contributor.author | Zou, X |
|---|---|
| dc.contributor.author | Chan, YC |
| dc.contributor.author | Webb, DP |
| dc.contributor.author | Lam, YW |
| dc.contributor.author | Hu, YF |
| dc.contributor.author | Beling, CD |
| dc.contributor.author | Fung, S |
| dc.contributor.author | Weng, HM |
| dc.date.accessioned | 2007-01-08T02:31:23Z |
| dc.date.available | 2007-01-08T02:31:23Z |
| dc.date.issued | 2000 |
| dc.description.abstract | We report changes in variable-energy positron annihilation spectroscopy measurements on undoped hydrogenated amorphous silicon films after light soaking. The change, seen predominantly in the high momentum band of the annihilation radiation, is not reversed by thermal annealing. We suggest, following recent models of the Staebler-Wronski effect, that light exposure induces hydrogen trapped in vacancylikc detects to become mobile in the Si network. The observations place constraints on models of hydrogen motion fitting macroscopic Staebler-Wronski effect kinetics and may help to achieve a definitive description of metastability in a-Si:H. |
| dc.description.nature | published_or_final_version |
| dc.format.extent | 73703 bytes |
| dc.format.extent | 9781 bytes |
| dc.format.mimetype | application/pdf |
| dc.format.mimetype | text/plain |
| dc.identifier.citation | Physical Review Letters, 2000, v. 84 n. 4, p. 769-772 [How to Cite?] DOI: http://dx.doi.org/10.1103/PhysRevLett.84.769 |
| dc.identifier.doi | http://dx.doi.org/10.1103/PhysRevLett.84.769 |
| dc.identifier.epage | 772 |
| dc.identifier.hkuros | 47811 |
| dc.identifier.isi | WOS:000084891700048 |
| dc.identifier.issn | 0031-9007 2011 Impact Factor: 7.37 2011 SCImago Journal Rankings: 0.633 |
| dc.identifier.issue | 4 |
| dc.identifier.openurl | ![]() |
| dc.identifier.scopus | eid_2-s2.0-0000224753 |
| dc.identifier.spage | 769 |
| dc.identifier.uri | http://hdl.handle.net/10722/42194 |
| dc.identifier.volume | 84 |
| dc.language | eng |
| dc.publisher | American Physical Society. The Journal's web site is located at http://prl.aps.org |
| dc.publisher.place | United States |
| dc.relation.ispartof | Physical Review Letters |
| dc.relation.references | References in Scopus |
| dc.rights | Physical Review Letters. Copyright © American Physical Society. |
| dc.rights | Creative Commons: Attribution 3.0 Hong Kong License |
| dc.subject | Physics |
| dc.title | Photoinduced Dehydrogenation of Defects in Undoped a-Si:H Using Positron Annihilation Spectroscopy |
| dc.type | Article |
Author Affiliations
- The University of Hong Kong
- University of Science and Technology of China
- City University of Hong Kong


