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Title | Author(s) | Issue Date | |
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Impact of random dopant fluctuations on trap-assisted tunnelling in nanoscale MOSFETs Journal:Microelectronics Reliability | 2012 |
Title | Author(s) | Issue Date | |
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Impact of random dopant fluctuations on trap-assisted tunnelling in nanoscale MOSFETs Journal:Microelectronics Reliability | 2012 |