File Download
  Links for fulltext
     (May Require Subscription)
Supplementary

postgraduate thesis: Electrical reliability of N-Mos devices with N2O-based oxides as gate dielectrics

TitleElectrical reliability of N-Mos devices with N2O-based oxides as gate dielectrics
Authors
Zeng, Xu曾旭
Issue Date1996
PublisherThe University of Hong Kong (Pokfulam, Hong Kong)
Citation
Zeng, X. [曾旭]. (1996). Electrical reliability of N-Mos devices with N2O-based oxides as gate dielectrics. (Thesis). University of Hong Kong, Pokfulam, Hong Kong SAR. Retrieved from http://dx.doi.org/10.5353/th_b3123547
DegreeDoctor of Philosophy
SubjectDielectrics.
Metal oxide semiconductors.
Nitrous oxide.
Dept/ProgramElectrical and Electronic Engineering
Persistent Identifierhttp://hdl.handle.net/10722/34628
HKU Library Item IDb3123547

 

DC FieldValueLanguage
dc.contributor.authorZeng, Xu-
dc.contributor.author曾旭-
dc.date.issued1996-
dc.identifier.citationZeng, X. [曾旭]. (1996). Electrical reliability of N-Mos devices with N2O-based oxides as gate dielectrics. (Thesis). University of Hong Kong, Pokfulam, Hong Kong SAR. Retrieved from http://dx.doi.org/10.5353/th_b3123547-
dc.identifier.urihttp://hdl.handle.net/10722/34628-
dc.languageeng-
dc.publisherThe University of Hong Kong (Pokfulam, Hong Kong)-
dc.relation.ispartofHKU Theses Online (HKUTO)-
dc.rightsThe author retains all proprietary rights, (such as patent rights) and the right to use in future works.-
dc.rightsThis work is licensed under a Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.-
dc.source.urihttp://hub.hku.hk/bib/B31235475-
dc.subject.lcshDielectrics.-
dc.subject.lcshMetal oxide semiconductors.-
dc.subject.lcshNitrous oxide.-
dc.titleElectrical reliability of N-Mos devices with N2O-based oxides as gate dielectrics-
dc.typePG_Thesis-
dc.identifier.hkulb3123547-
dc.description.thesisnameDoctor of Philosophy-
dc.description.thesislevelDoctoral-
dc.description.thesisdisciplineElectrical and Electronic Engineering-
dc.description.naturepublished_or_final_version-
dc.identifier.doi10.5353/th_b3123547-
dc.date.hkucongregation1996-
dc.identifier.mmsid991012383309703414-

Export via OAI-PMH Interface in XML Formats

OR

Export to Other Non-XML Formats