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postgraduate thesis: Microstructure characterization of high Tc superconducting thin films and multilayer Josephson junctions

TitleMicrostructure characterization of high Tc superconducting thin films and multilayer Josephson junctions
Authors
Issue Date1998
PublisherThe University of Hong Kong (Pokfulam, Hong Kong)
Citation
Yang, Y. [楊曄]. (1998). Microstructure characterization of high Tc superconducting thin films and multilayer Josephson junctions. (Thesis). University of Hong Kong, Pokfulam, Hong Kong SAR. Retrieved from http://dx.doi.org/10.5353/th_b3122018
DegreeMaster of Philosophy
SubjectThin films.
High temperature superconductors.
Josephson junctions.
Dept/ProgramPhysics

 

DC FieldValueLanguage
dc.contributor.authorYang, Ye.-
dc.contributor.author楊曄-
dc.date.issued1998-
dc.identifier.citationYang, Y. [楊曄]. (1998). Microstructure characterization of high Tc superconducting thin films and multilayer Josephson junctions. (Thesis). University of Hong Kong, Pokfulam, Hong Kong SAR. Retrieved from http://dx.doi.org/10.5353/th_b3122018-
dc.languageeng-
dc.publisherThe University of Hong Kong (Pokfulam, Hong Kong)-
dc.relation.ispartofHKU Theses Online (HKUTO)-
dc.rightsThe author retains all proprietary rights, (such as patent rights) and the right to use in future works.-
dc.rightsCreative Commons: Attribution 3.0 Hong Kong License-
dc.source.urihttp://hub.hku.hk/bib/B31220186-
dc.subject.lcshThin films.-
dc.subject.lcshHigh temperature superconductors.-
dc.subject.lcshJosephson junctions.-
dc.titleMicrostructure characterization of high Tc superconducting thin films and multilayer Josephson junctions-
dc.typePG_Thesis-
dc.identifier.hkulb3122018-
dc.description.thesisnameMaster of Philosophy-
dc.description.thesislevelMaster-
dc.description.thesisdisciplinePhysics-
dc.description.naturepublished_or_final_version-
dc.identifier.doi10.5353/th_b3122018-
dc.date.hkucongregation1998-

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