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postgraduate thesis: Optical characterization of defects in GaN

TitleOptical characterization of defects in GaN
Authors
Advisors
Advisor(s):Xie, MHXu, S
Issue Date2001
PublisherThe University of Hong Kong (Pokfulam, Hong Kong)
Citation
Or, C. [柯俊達]. (2001). Optical characterization of defects in GaN. (Thesis). University of Hong Kong, Pokfulam, Hong Kong SAR. Retrieved from http://dx.doi.org/10.5353/th_b3122660
DegreeMaster of Philosophy
SubjectGallium nitride.
Luminescence spectroscopy.
Semiconductors - Testing - Optical methods
Dept/ProgramPhysics

 

DC FieldValueLanguage
dc.contributor.advisorXie, MH-
dc.contributor.advisorXu, S-
dc.contributor.authorOr, Chun-tat.-
dc.contributor.author柯俊達-
dc.date.issued2001-
dc.identifier.citationOr, C. [柯俊達]. (2001). Optical characterization of defects in GaN. (Thesis). University of Hong Kong, Pokfulam, Hong Kong SAR. Retrieved from http://dx.doi.org/10.5353/th_b3122660-
dc.languageeng-
dc.publisherThe University of Hong Kong (Pokfulam, Hong Kong)-
dc.relation.ispartofHKU Theses Online (HKUTO)-
dc.rightsThe author retains all proprietary rights, (such as patent rights) and the right to use in future works.-
dc.rightsCreative Commons: Attribution 3.0 Hong Kong License-
dc.source.urihttp://hub.hku.hk/bib/B31226607-
dc.subject.lcshGallium nitride.-
dc.subject.lcshLuminescence spectroscopy.-
dc.subject.lcshSemiconductors - Testing - Optical methods-
dc.titleOptical characterization of defects in GaN-
dc.typePG_Thesis-
dc.identifier.hkulb3122660-
dc.description.thesisnameMaster of Philosophy-
dc.description.thesislevelMaster-
dc.description.thesisdisciplinePhysics-
dc.description.naturepublished_or_final_version-
dc.identifier.doi10.5353/th_b3122660-
dc.date.hkucongregation2002-

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