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postgraduate thesis: Inversion of low energy electron diffraction IV spectra of reconstructed structure of SiC (0001)

TitleInversion of low energy electron diffraction IV spectra of reconstructed structure of SiC (0001)
Authors
Advisors
Advisor(s):Wu, HS
Issue Date2000
PublisherThe University of Hong Kong (Pokfulam, Hong Kong)
Citation
Ng, T. V. [吳子傑]. (2000). Inversion of low energy electron diffraction IV spectra of reconstructed structure of SiC (0001). (Thesis). University of Hong Kong, Pokfulam, Hong Kong SAR. Retrieved from http://dx.doi.org/10.5353/th_b3122500
DegreeMaster of Philosophy
SubjectSilicon carbide
Low energy electron diffraction.
Surfaces (Physics)
Dept/ProgramPhysics

 

DC FieldValueLanguage
dc.contributor.advisorWu, HS-
dc.contributor.authorNg, Tsz-kit, Victor.-
dc.contributor.author吳子傑-
dc.date.issued2000-
dc.identifier.citationNg, T. V. [吳子傑]. (2000). Inversion of low energy electron diffraction IV spectra of reconstructed structure of SiC (0001). (Thesis). University of Hong Kong, Pokfulam, Hong Kong SAR. Retrieved from http://dx.doi.org/10.5353/th_b3122500-
dc.languageeng-
dc.publisherThe University of Hong Kong (Pokfulam, Hong Kong)-
dc.relation.ispartofHKU Theses Online (HKUTO)-
dc.rightsThe author retains all proprietary rights, (such as patent rights) and the right to use in future works.-
dc.rightsCreative Commons: Attribution 3.0 Hong Kong License-
dc.source.urihttp://hub.hku.hk/bib/B31225007-
dc.subject.lcshSilicon carbide-
dc.subject.lcshLow energy electron diffraction.-
dc.subject.lcshSurfaces (Physics)-
dc.titleInversion of low energy electron diffraction IV spectra of reconstructed structure of SiC (0001)-
dc.typePG_Thesis-
dc.identifier.hkulb3122500-
dc.description.thesisnameMaster of Philosophy-
dc.description.thesislevelMaster-
dc.description.thesisdisciplinePhysics-
dc.description.naturepublished_or_final_version-
dc.identifier.doi10.5353/th_b3122500-
dc.date.hkucongregation2001-

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