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postgraduate thesis: Estimation of the impact of patterning error on MOSFET by conformal mapping

TitleEstimation of the impact of patterning error on MOSFET by conformal mapping
Authors
Advisors
Advisor(s):Lai, PT
Issue Date2004
PublisherThe University of Hong Kong (Pokfulam, Hong Kong)
Citation
Pun, C. [潘昭豪]. (2004). Estimation of the impact of patterning error on MOSFET by conformal mapping. (Thesis). University of Hong Kong, Pokfulam, Hong Kong SAR. Retrieved from http://dx.doi.org/10.5353/th_b3073083
DegreeMaster of Philosophy
SubjectIntegrated circuits - Testing.
Conformal mapping.
Integrated circuits - Design and construction.
Semiconductors - Design and construction.
Dept/ProgramElectrical and Electronic Engineering

 

DC FieldValueLanguage
dc.contributor.advisorLai, PT-
dc.contributor.authorPun, Chiu-ho.-
dc.contributor.author潘昭豪.-
dc.date.issued2004-
dc.identifier.citationPun, C. [潘昭豪]. (2004). Estimation of the impact of patterning error on MOSFET by conformal mapping. (Thesis). University of Hong Kong, Pokfulam, Hong Kong SAR. Retrieved from http://dx.doi.org/10.5353/th_b3073083-
dc.languageeng-
dc.publisherThe University of Hong Kong (Pokfulam, Hong Kong)-
dc.relation.ispartofHKU Theses Online (HKUTO)-
dc.rightsThe author retains all proprietary rights, (such as patent rights) and the right to use in future works.-
dc.rightsCreative Commons: Attribution 3.0 Hong Kong License-
dc.source.urihttp://hub.hku.hk/bib/B30730831-
dc.subject.lcshIntegrated circuits - Testing.-
dc.subject.lcshConformal mapping.-
dc.subject.lcshIntegrated circuits - Design and construction.-
dc.subject.lcshSemiconductors - Design and construction.-
dc.titleEstimation of the impact of patterning error on MOSFET by conformal mapping-
dc.typePG_Thesis-
dc.identifier.hkulb3073083-
dc.description.thesisnameMaster of Philosophy-
dc.description.thesislevelMaster-
dc.description.thesisdisciplineElectrical and Electronic Engineering-
dc.description.naturepublished_or_final_version-
dc.description.natureabstract-
dc.description.naturetoc-
dc.identifier.doi10.5353/th_b3073083-
dc.date.hkucongregation2005-

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