Supplementary

Postgraduate Thesis: Fabric defect detection by wavelet transform and neural network
  • Basic View
  • Metadata View
  • XML View
TitleFabric defect detection by wavelet transform and neural network
 
AuthorsLee, Tin-chi.
李天賜.
 
Issue Date2004
 
PublisherThe University of Hong Kong (Pokfulam, Hong Kong)
 
AdvisorsPang, GKH
 
DegreeMaster of Philosophy
 
SubjectTextile fabrics - Testing.
Wavelets (Mathematics)
Neural networks (Computer science)
 
Dept/ProgramElectrical and Electronic Engineering
 
DOIhttp://dx.doi.org/10.5353/th_b2928728
 
DC FieldValue
dc.contributor.advisorPang, GKH
 
dc.contributor.authorLee, Tin-chi.
 
dc.contributor.author李天賜.
 
dc.date.hkucongregation2004
 
dc.date.issued2004
 
dc.description.naturepublished_or_final_version
 
dc.description.natureabstract
 
dc.description.naturetoc
 
dc.description.thesisdisciplineElectrical and Electronic Engineering
 
dc.description.thesislevelmaster's
 
dc.description.thesisnameMaster of Philosophy
 
dc.identifier.doihttp://dx.doi.org/10.5353/th_b2928728
 
dc.identifier.hkulb2928728
 
dc.languageeng
 
dc.publisherThe University of Hong Kong (Pokfulam, Hong Kong)
 
dc.relation.ispartofHKU Theses Online (HKUTO)
 
dc.rightsThe author retains all proprietary rights, (such as patent rights) and the right to use in future works.
 
dc.rightsCreative Commons: Attribution 3.0 Hong Kong License
 
dc.source.urihttp://hub.hku.hk/bib/B29287285
 
dc.subject.lcshTextile fabrics - Testing.
 
dc.subject.lcshWavelets (Mathematics)
 
dc.subject.lcshNeural networks (Computer science)
 
dc.titleFabric defect detection by wavelet transform and neural network
 
dc.typePG_Thesis
 
<?xml encoding="utf-8" version="1.0"?>
<item><contributor.advisor>Pang, GKH</contributor.advisor>
<contributor.author>Lee, Tin-chi.</contributor.author>
<contributor.author>&#26446;&#22825;&#36060;.</contributor.author>
<date.issued>2004</date.issued>
<language>eng</language>
<publisher>The University of Hong Kong (Pokfulam, Hong Kong)</publisher>
<relation.ispartof>HKU Theses Online (HKUTO)</relation.ispartof>
<rights>The author retains all proprietary rights, (such as patent rights) and the right to use in future works.</rights>
<rights>Creative Commons: Attribution 3.0 Hong Kong License</rights>
<source.uri>http://hub.hku.hk/bib/B29287285</source.uri>
<subject.lcsh>Textile fabrics - Testing.</subject.lcsh>
<subject.lcsh>Wavelets (Mathematics)</subject.lcsh>
<subject.lcsh>Neural networks (Computer science)</subject.lcsh>
<title>Fabric defect detection by wavelet transform and neural network</title>
<type>PG_Thesis</type>
<identifier.hkul>b2928728</identifier.hkul>
<description.thesisname>Master of Philosophy</description.thesisname>
<description.thesislevel>master&apos;s</description.thesislevel>
<description.thesisdiscipline>Electrical and Electronic Engineering</description.thesisdiscipline>
<description.nature>published_or_final_version</description.nature>
<description.nature>abstract</description.nature>
<description.nature>toc</description.nature>
<identifier.doi>10.5353/th_b2928728</identifier.doi>
<date.hkucongregation>2004</date.hkucongregation>
<bitstream.url>http://hub.hku.hk/bitstream/10722/31046/11/Bibliography.pdf</bitstream.url>
<bitstream.url>http://hub.hku.hk/bitstream/10722/31046/12/Table%20of%20Contents.pdf</bitstream.url>
<bitstream.url>http://hub.hku.hk/bitstream/10722/31046/13/Title%20Page.pdf</bitstream.url>
<bitstream.url>http://hub.hku.hk/bitstream/10722/31046/14/Abstract.pdf</bitstream.url>
<bitstream.url>http://hub.hku.hk/bitstream/10722/31046/15/FullText.pdf</bitstream.url>
</item>