Postgraduate Thesis: Fabric defect detection by wavelet transform and neural network

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TitleFabric defect detection by wavelet transform and neural network
AuthorsLee, Tin-chi.
李天賜.
Issue Date2004
PublisherThe University of Hong Kong (Pokfulam, Hong Kong)
AdvisorsPang, GKH
DegreeMaster of Philosophy
SubjectTextile fabrics - Testing.
Wavelets (Mathematics)
Neural networks (Computer science)
Dept/ProgramElectrical and Electronic Engineering
DOIhttp://dx.doi.org/10.5353/th_b2928728
DC Field
Value
dc.contributor.advisorPang, GKH
dc.contributor.authorLee, Tin-chi.
dc.contributor.author李天賜.
dc.date.hkucongregation2004
dc.date.issued2004
dc.description.naturepublished_or_final_version
dc.description.natureabstract
dc.description.naturetoc
dc.description.thesisdisciplineElectrical and Electronic Engineering
dc.description.thesislevelmaster's
dc.description.thesisnameMaster of Philosophy
dc.identifier.doihttp://dx.doi.org/10.5353/th_b2928728
dc.identifier.hkulb2928728
dc.languageeng
dc.publisherThe University of Hong Kong (Pokfulam, Hong Kong)
dc.relation.ispartofHKU Theses Online (HKUTO)
dc.rightsThe author retains all proprietary rights, (such as patent rights) and the right to use in future works.
dc.rightsCreative Commons: Attribution 3.0 Hong Kong License
dc.source.urihttp://hub.hku.hk/bib/B29287285
dc.subject.lcshTextile fabrics - Testing.
dc.subject.lcshWavelets (Mathematics)
dc.subject.lcshNeural networks (Computer science)
dc.titleFabric defect detection by wavelet transform and neural network
dc.typePG_Thesis