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Article: Fast and robust misalignment correction of Fourier ptychographic microscopy for full field of view reconstruction

TitleFast and robust misalignment correction of Fourier ptychographic microscopy for full field of view reconstruction
Authors
KeywordsOptical constants
Optics
Issue Date2018
PublisherOptical Society of America: Open Access Journals. The Journal's web site is located at http://www.opticsexpress.org
Citation
Optics Express, 2018, v. 26 n. 18, p. 23661-23674 How to Cite?
AbstractFourier ptychographic microscopy (FPM) is a newly developed computational imaging technique that can provide gigapixel images with both high resolution (HR) and wide field of view (FOV). However, there are two possible reasons for position misalignment, which induce a degradation of the reconstructed image. The first one is the position misalignment of the LED array, which can largely be eliminated during the experimental system building process. The more important one is the segment-dependent position misalignment. Note that, this segment-dependent positional misalignment still exists, even after we correct the central coordinates of every small segment. In this paper, we carefully analyze this segment-dependent misalignment and find that this global shift matters more, compared with the rotational misalignments. According to this fact, we propose a robust and fast method to correct the two factors of position misalignment of the FPM, termed as misalignment correction for the FPM misalignment correction (mcFPM). Although different regions in the FOV have different sensitivities to the position misalignment, the experimental results show that the mcFPM is robust with respect to the elimination of each region. Compared with the state-of-the-art methods, the mcFPM is much faster.
Persistent Identifierhttp://hdl.handle.net/10722/278146
ISSN
2019 Impact Factor: 3.669
2015 SCImago Journal Rankings: 2.186
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorZhou, A-
dc.contributor.authorWang, W-
dc.contributor.authorChen, N-
dc.contributor.authorLam, EY-
dc.contributor.authorLee, B-
dc.contributor.authorSitu, G-
dc.date.accessioned2019-10-04T08:08:23Z-
dc.date.available2019-10-04T08:08:23Z-
dc.date.issued2018-
dc.identifier.citationOptics Express, 2018, v. 26 n. 18, p. 23661-23674-
dc.identifier.issn1094-4087-
dc.identifier.urihttp://hdl.handle.net/10722/278146-
dc.description.abstractFourier ptychographic microscopy (FPM) is a newly developed computational imaging technique that can provide gigapixel images with both high resolution (HR) and wide field of view (FOV). However, there are two possible reasons for position misalignment, which induce a degradation of the reconstructed image. The first one is the position misalignment of the LED array, which can largely be eliminated during the experimental system building process. The more important one is the segment-dependent position misalignment. Note that, this segment-dependent positional misalignment still exists, even after we correct the central coordinates of every small segment. In this paper, we carefully analyze this segment-dependent misalignment and find that this global shift matters more, compared with the rotational misalignments. According to this fact, we propose a robust and fast method to correct the two factors of position misalignment of the FPM, termed as misalignment correction for the FPM misalignment correction (mcFPM). Although different regions in the FOV have different sensitivities to the position misalignment, the experimental results show that the mcFPM is robust with respect to the elimination of each region. Compared with the state-of-the-art methods, the mcFPM is much faster.-
dc.languageeng-
dc.publisherOptical Society of America: Open Access Journals. The Journal's web site is located at http://www.opticsexpress.org-
dc.relation.ispartofOptics Express-
dc.rightsOptics Express. Copyright © Optical Society of America: Open Access Journals.-
dc.rights© 2018 [year] Optical Society of America]. Users may use, reuse, and build upon the article, or use the article for text or data mining, so long as such uses are for non-commercial purposes and appropriate attribution is maintained. All other rights are reserved.-
dc.subjectOptical constants-
dc.subjectOptics-
dc.titleFast and robust misalignment correction of Fourier ptychographic microscopy for full field of view reconstruction-
dc.typeArticle-
dc.identifier.emailLam, EY: elam@eee.hku.hk-
dc.identifier.authorityLam, EY=rp00131-
dc.description.naturepublished_or_final_version-
dc.identifier.doi10.1364/OE.26.023661-
dc.identifier.pmid30184864-
dc.identifier.scopuseid_2-s2.0-85052691616-
dc.identifier.hkuros306260-
dc.identifier.volume26-
dc.identifier.issue18-
dc.identifier.spage23661-
dc.identifier.epage23674-
dc.identifier.isiWOS:000443431400110-
dc.publisher.placeUnited States-
dc.identifier.issnl1094-4087-

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