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postgraduate thesis: Defect detection in semiconductor die images

TitleDefect detection in semiconductor die images
Authors
Advisors
Advisor(s):Lam, EYM
Issue Date2005
PublisherThe University of Hong Kong (Pokfulam, Hong Kong)
Citation
Ng, N. A. [伍雅怡]. (2005). Defect detection in semiconductor die images. (Thesis). University of Hong Kong, Pokfulam, Hong Kong SAR. Retrieved from http://dx.doi.org/10.5353/th_b3204079
DegreeMaster of Philosophy
SubjectIntegrated circuits - Testing.
Algorithms.
Dept/ProgramElectrical and Electronic Engineering
Persistent Identifierhttp://hdl.handle.net/10722/26515
HKU Library Item IDb3204079

 

DC FieldValueLanguage
dc.contributor.advisorLam, EYM-
dc.contributor.authorNg, Nga-yi, Ada.-
dc.contributor.author伍雅怡.-
dc.date.issued2005-
dc.identifier.citationNg, N. A. [伍雅怡]. (2005). Defect detection in semiconductor die images. (Thesis). University of Hong Kong, Pokfulam, Hong Kong SAR. Retrieved from http://dx.doi.org/10.5353/th_b3204079-
dc.identifier.urihttp://hdl.handle.net/10722/26515-
dc.languageeng-
dc.publisherThe University of Hong Kong (Pokfulam, Hong Kong)-
dc.relation.ispartofHKU Theses Online (HKUTO)-
dc.rightsThe author retains all proprietary rights, (such as patent rights) and the right to use in future works.-
dc.rightsThis work is licensed under a Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.-
dc.source.urihttp://hub.hku.hk/bib/B32040799-
dc.subject.lcshIntegrated circuits - Testing.-
dc.subject.lcshAlgorithms.-
dc.titleDefect detection in semiconductor die images-
dc.typePG_Thesis-
dc.identifier.hkulb3204079-
dc.description.thesisnameMaster of Philosophy-
dc.description.thesislevelMaster-
dc.description.thesisdisciplineElectrical and Electronic Engineering-
dc.description.naturepublished_or_final_version-
dc.description.natureabstract-
dc.identifier.doi10.5353/th_b3204079-
dc.date.hkucongregation2005-
dc.identifier.mmsid991015600829703414-

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