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- Publisher Website: 10.1109/TR.2017.2728625
- Scopus: eid_2-s2.0-85028503464
- WOS: WOS:000417909300004
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Article: Optimal sequential ALT plans for systems with mixture of one-shot units
Title | Optimal sequential ALT plans for systems with mixture of one-shot units |
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Authors | |
Keywords | System reliability metrics One-shot units Sampling Sequential accelerated nondestructive testing (NDT) plans Physics-statistics-based model Nonhomogeneous |
Issue Date | 2017 |
Citation | IEEE Transactions on Reliability, 2017, v. 66, n. 4, p. 997-1011 How to Cite? |
Abstract | © 2017 IEEE. In this paper, we investigate a system composed of mixtures of one-shot units with nonhomogeneous and time-dependent characteristics. We propose analytical expressions to predict system reliability metrics and consider a physics-statistics-based lifetime model to demonstrate the units’ failure mechanism as well as its failure process uncertainty. We design a sequence of optimum accelerated non-destructive testing (NDT) plans to predict the reliability metrics of the system and show that a well-designed sequential accelerated NDTs is an effective approach to shorten the test duration with negligible consequence on system reliability metrics. |
Persistent Identifier | http://hdl.handle.net/10722/262763 |
ISSN | 2021 Impact Factor: 5.883 2020 SCImago Journal Rankings: 1.032 |
ISI Accession Number ID |
DC Field | Value | Language |
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dc.contributor.author | Cheng, Yao | - |
dc.contributor.author | Elsayed, Elsayed A. | - |
dc.date.accessioned | 2018-10-08T02:46:58Z | - |
dc.date.available | 2018-10-08T02:46:58Z | - |
dc.date.issued | 2017 | - |
dc.identifier.citation | IEEE Transactions on Reliability, 2017, v. 66, n. 4, p. 997-1011 | - |
dc.identifier.issn | 0018-9529 | - |
dc.identifier.uri | http://hdl.handle.net/10722/262763 | - |
dc.description.abstract | © 2017 IEEE. In this paper, we investigate a system composed of mixtures of one-shot units with nonhomogeneous and time-dependent characteristics. We propose analytical expressions to predict system reliability metrics and consider a physics-statistics-based lifetime model to demonstrate the units’ failure mechanism as well as its failure process uncertainty. We design a sequence of optimum accelerated non-destructive testing (NDT) plans to predict the reliability metrics of the system and show that a well-designed sequential accelerated NDTs is an effective approach to shorten the test duration with negligible consequence on system reliability metrics. | - |
dc.language | eng | - |
dc.relation.ispartof | IEEE Transactions on Reliability | - |
dc.subject | System reliability metrics | - |
dc.subject | One-shot units | - |
dc.subject | Sampling | - |
dc.subject | Sequential accelerated nondestructive testing (NDT) plans | - |
dc.subject | Physics-statistics-based model | - |
dc.subject | Nonhomogeneous | - |
dc.title | Optimal sequential ALT plans for systems with mixture of one-shot units | - |
dc.type | Article | - |
dc.description.nature | link_to_subscribed_fulltext | - |
dc.identifier.doi | 10.1109/TR.2017.2728625 | - |
dc.identifier.scopus | eid_2-s2.0-85028503464 | - |
dc.identifier.hkuros | 325692 | - |
dc.identifier.volume | 66 | - |
dc.identifier.issue | 4 | - |
dc.identifier.spage | 997 | - |
dc.identifier.epage | 1011 | - |
dc.identifier.isi | WOS:000417909300004 | - |
dc.identifier.issnl | 0018-9529 | - |