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Article: Simultaneous Thermoelectric Property Measurement and Incoherent Phonon Transport in Holey Silicon

TitleSimultaneous Thermoelectric Property Measurement and Incoherent Phonon Transport in Holey Silicon
Authors
Issue Date2016
Citation
ACS Nano, 2016, v. 10, p. 124-132 How to Cite?
Persistent Identifierhttp://hdl.handle.net/10722/234502

 

DC FieldValueLanguage
dc.contributor.authorLim, J-
dc.contributor.authorWang, H-
dc.contributor.authorTang, J-
dc.contributor.authorAndrews, S-
dc.contributor.authorSo, H-
dc.contributor.authorLee, J-
dc.contributor.authorLee, D-
dc.contributor.authorRussell, T-
dc.contributor.authorYang, P-
dc.date.accessioned2016-10-14T13:47:18Z-
dc.date.available2016-10-14T13:47:18Z-
dc.date.issued2016-
dc.identifier.citationACS Nano, 2016, v. 10, p. 124-132-
dc.identifier.urihttp://hdl.handle.net/10722/234502-
dc.languageeng-
dc.relation.ispartofACS Nano-
dc.titleSimultaneous Thermoelectric Property Measurement and Incoherent Phonon Transport in Holey Silicon-
dc.typeArticle-
dc.identifier.emailTang, J: jinyao@hku.hk-
dc.identifier.authorityTang, J=rp01677-
dc.identifier.doi10.1021/acsnano.5b05385-
dc.identifier.hkuros269315-
dc.identifier.volume10-
dc.identifier.spage124-
dc.identifier.epage132-

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