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Conference Paper: Emission characteristics of light-emitting diodes by confocal microscopy

TitleEmission characteristics of light-emitting diodes by confocal microscopy
Authors
Issue Date2016
PublisherSPIE - International Society for Optical Engineering. The Journal's web site is located at http://spie.org/x1848.xml?WT.svl=mddp2
Citation
The 2016 SPIE Photonics West Conference, San Francisco, CA., 13-18 February 2016. In Conference Proceedings, 2016, v. 9768, paper no. 9768-18 How to Cite?
AbstractThe emission profiles of light-emitting diodes have typically be measured by goniophotometry. However this technique suffers from several drawbacks, including the inability to generate three-dimensional intensity profiles as well as poor spatial resolution. These limitations are particularly pronounced when the technique is used to compared devices whose emission patterns have been modified through surface texturing at the micrometer and nanometer scales,. In view of such limitations, confocal microscopy has been adopted for the study of emission characteristics of LEDs. This enables three-dimensional emission maps to be collected, from which two-dimensional cross-sectional emission profiles can be generated. Of course, there are limitations associated with confocal microscopy, including the range of emission angles that can be measured due to the limited acceptance angle of the objective. As an illustration, the technique has been adopted to compare the emission profiles of LEDs with different divergence angles using an objective with a numerical aperture of 0.8. It is found that the results are consistent with those obtained by goniophotometry when the divergence angle is less that the acceptance angle of the objective. © (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE).
DescriptionSPIE OPTO - part of SPIE Photonics West
Vol 9768: Light-Emitting Diodes: Materials, Devices, and Applications for Solid State Lighting XX
Session 4 - Novel Technologies for LED Design and Fabrication 1: paper 9726-18
Persistent Identifierhttp://hdl.handle.net/10722/232275
ISSN

 

DC FieldValueLanguage
dc.contributor.authorCheung, WS-
dc.contributor.authorChoi, HW-
dc.date.accessioned2016-09-20T05:28:54Z-
dc.date.available2016-09-20T05:28:54Z-
dc.date.issued2016-
dc.identifier.citationThe 2016 SPIE Photonics West Conference, San Francisco, CA., 13-18 February 2016. In Conference Proceedings, 2016, v. 9768, paper no. 9768-18-
dc.identifier.issn0277-786X-
dc.identifier.urihttp://hdl.handle.net/10722/232275-
dc.descriptionSPIE OPTO - part of SPIE Photonics West-
dc.descriptionVol 9768: Light-Emitting Diodes: Materials, Devices, and Applications for Solid State Lighting XX-
dc.descriptionSession 4 - Novel Technologies for LED Design and Fabrication 1: paper 9726-18-
dc.description.abstractThe emission profiles of light-emitting diodes have typically be measured by goniophotometry. However this technique suffers from several drawbacks, including the inability to generate three-dimensional intensity profiles as well as poor spatial resolution. These limitations are particularly pronounced when the technique is used to compared devices whose emission patterns have been modified through surface texturing at the micrometer and nanometer scales,. In view of such limitations, confocal microscopy has been adopted for the study of emission characteristics of LEDs. This enables three-dimensional emission maps to be collected, from which two-dimensional cross-sectional emission profiles can be generated. Of course, there are limitations associated with confocal microscopy, including the range of emission angles that can be measured due to the limited acceptance angle of the objective. As an illustration, the technique has been adopted to compare the emission profiles of LEDs with different divergence angles using an objective with a numerical aperture of 0.8. It is found that the results are consistent with those obtained by goniophotometry when the divergence angle is less that the acceptance angle of the objective. © (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE).-
dc.languageeng-
dc.publisherSPIE - International Society for Optical Engineering. The Journal's web site is located at http://spie.org/x1848.xml?WT.svl=mddp2-
dc.relation.ispartofSPIE - International Society for Optical Engineering. Proceedings-
dc.rightsSPIE - International Society for Optical Engineering. Proceedings. Copyright © SPIE - International Society for Optical Engineering.-
dc.titleEmission characteristics of light-emitting diodes by confocal microscopy-
dc.typeConference_Paper-
dc.identifier.emailChoi, HW: hwchoi@hku.hk-
dc.identifier.authorityChoi, HW=rp00108-
dc.identifier.doi10.1117/12.2213111-
dc.identifier.hkuros263486-
dc.identifier.volume9768, paper no. 9768-18-
dc.publisher.placeUnited States-
dc.description.otherThe 2016 SPIE Photonics West Conference, San Francisco, CA., 13-18 February 2016. In Conference Proceedings, 2016, v. 9768, paper no. 9768-18-

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