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Article: Colloidal wettability probed with X-ray microscopy

TitleColloidal wettability probed with X-ray microscopy
Authors
KeywordsColloidal wettability
Issue Date2012
Citation
Current Opinion in Colloid and Interface Science, 2012, v. 17, n. 6, p. 388-395 How to Cite?
AbstractColloids (colloidal particles or nanoparticles) and their in-situ characterizations are important topics in colloid and interface science. In-situ visualization of colloids with X-ray microscopy is a growing frontier. Here, after a brief introduction on the method, we focus on its application for identifying nanoscale wettability of colloidal particles at fluid interfaces, which is a critical factor in colloidal self-assembly. We discuss a quantitative study on colloidal wettability with two microscopic methods: (i) X-ray microscopy by visualizing natural oil-water interfaces and (ii) confocal microscopy by visualizing fluorescently-labeled interfaces. Both methods show consistent estimation results in colloid-fluid interfacial tensions. This comparison strongly suggests a feasibility of X-ray microscopy as a promising in-situ protocol in colloid research, without fluorescent staining. Finally, we address a prospect of X-ray imaging for colloid and interface science. © 2012 Elsevier Ltd.
Persistent Identifierhttp://hdl.handle.net/10722/226701
ISSN
2015 Impact Factor: 6.234
2015 SCImago Journal Rankings: 1.924

 

DC FieldValueLanguage
dc.contributor.authorWeon, Byung Mook-
dc.contributor.authorLee, Ji San-
dc.contributor.authorKim, Ji Tae-
dc.contributor.authorPyo, Jaeyeon-
dc.contributor.authorJe, Jung Ho-
dc.date.accessioned2016-06-29T01:58:20Z-
dc.date.available2016-06-29T01:58:20Z-
dc.date.issued2012-
dc.identifier.citationCurrent Opinion in Colloid and Interface Science, 2012, v. 17, n. 6, p. 388-395-
dc.identifier.issn1359-0294-
dc.identifier.urihttp://hdl.handle.net/10722/226701-
dc.description.abstractColloids (colloidal particles or nanoparticles) and their in-situ characterizations are important topics in colloid and interface science. In-situ visualization of colloids with X-ray microscopy is a growing frontier. Here, after a brief introduction on the method, we focus on its application for identifying nanoscale wettability of colloidal particles at fluid interfaces, which is a critical factor in colloidal self-assembly. We discuss a quantitative study on colloidal wettability with two microscopic methods: (i) X-ray microscopy by visualizing natural oil-water interfaces and (ii) confocal microscopy by visualizing fluorescently-labeled interfaces. Both methods show consistent estimation results in colloid-fluid interfacial tensions. This comparison strongly suggests a feasibility of X-ray microscopy as a promising in-situ protocol in colloid research, without fluorescent staining. Finally, we address a prospect of X-ray imaging for colloid and interface science. © 2012 Elsevier Ltd.-
dc.languageeng-
dc.relation.ispartofCurrent Opinion in Colloid and Interface Science-
dc.subjectColloidal wettability-
dc.titleColloidal wettability probed with X-ray microscopy-
dc.typeArticle-
dc.description.natureLink_to_subscribed_fulltext-
dc.identifier.doi10.1016/j.cocis.2012.08.002-
dc.identifier.scopuseid_2-s2.0-84870701222-
dc.identifier.volume17-
dc.identifier.issue6-
dc.identifier.spage388-
dc.identifier.epage395-
dc.identifier.eissn1879-0399-

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