File Download
Links for fulltext
(May Require Subscription)
- Publisher Website: 10.1063/1.4934840
- Scopus: eid_2-s2.0-84945933472
- WOS: WOS:000364234200003
- Find via
Supplementary
- Citations:
- Appears in Collections:
Article: Confocal microscopic analysis of optical crosstalk in GaN micro-pixel light-emitting diodes
Title | Confocal microscopic analysis of optical crosstalk in GaN micro-pixel light-emitting diodes |
---|---|
Authors | |
Issue Date | 2015 |
Publisher | AIP Publishing LLC. The Journal's web site is located at http://apl.aip.org/ |
Citation | Applied Physics Letters, 2015, v. 107 n. 17, article no. 171103 How to Cite? |
Abstract | © 2015 AIP Publishing LLC. The optical crosstalk phenomenon in GaN micro-pixel light-emitting diodes (LED) has been investigated by confocal microscopy. Depth-resolved confocal emission images indicate light channeling along the GaN and sapphire layers as the source of crosstalk. Thin-film micro-pixel devices are proposed, whereby the light-trapping sapphire layers are removed by laser lift-off. Optical crosstalk is significantly reduced but not eliminated due to the remaining GaN layer. Another design involving micro-pixels which are completely isolated is further proposed; such devices exhibited low-noise and enhanced optical performances, which are important attributes for high-density micro-pixel LED applications including micro-displays and multi-channel optical communications. |
Persistent Identifier | http://hdl.handle.net/10722/225091 |
ISSN | 2023 Impact Factor: 3.5 2023 SCImago Journal Rankings: 0.976 |
ISI Accession Number ID |
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Li, K. H. | - |
dc.contributor.author | Cheung, Y. F. | - |
dc.contributor.author | Cheung, W. S. | - |
dc.contributor.author | Choi, H. W. | - |
dc.date.accessioned | 2016-04-18T11:16:45Z | - |
dc.date.available | 2016-04-18T11:16:45Z | - |
dc.date.issued | 2015 | - |
dc.identifier.citation | Applied Physics Letters, 2015, v. 107 n. 17, article no. 171103 | - |
dc.identifier.issn | 0003-6951 | - |
dc.identifier.uri | http://hdl.handle.net/10722/225091 | - |
dc.description.abstract | © 2015 AIP Publishing LLC. The optical crosstalk phenomenon in GaN micro-pixel light-emitting diodes (LED) has been investigated by confocal microscopy. Depth-resolved confocal emission images indicate light channeling along the GaN and sapphire layers as the source of crosstalk. Thin-film micro-pixel devices are proposed, whereby the light-trapping sapphire layers are removed by laser lift-off. Optical crosstalk is significantly reduced but not eliminated due to the remaining GaN layer. Another design involving micro-pixels which are completely isolated is further proposed; such devices exhibited low-noise and enhanced optical performances, which are important attributes for high-density micro-pixel LED applications including micro-displays and multi-channel optical communications. | - |
dc.language | eng | - |
dc.publisher | AIP Publishing LLC. The Journal's web site is located at http://apl.aip.org/ | - |
dc.relation.ispartof | Applied Physics Letters | - |
dc.rights | Copyright 2015 AIP Publishing LLC. This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. The following article appeared in Applied Physics Letters, 2015, v. 107 n. 17, article no. 171103 and may be found at https://doi.org/10.1063/1.4934840 | - |
dc.title | Confocal microscopic analysis of optical crosstalk in GaN micro-pixel light-emitting diodes | - |
dc.type | Article | - |
dc.description.nature | published_or_final_version | - |
dc.identifier.doi | 10.1063/1.4934840 | - |
dc.identifier.scopus | eid_2-s2.0-84945933472 | - |
dc.identifier.hkuros | 263400 | - |
dc.identifier.volume | 107 | - |
dc.identifier.issue | 17 | - |
dc.identifier.spage | article no. 171103 | - |
dc.identifier.epage | article no. 171103 | - |
dc.identifier.isi | WOS:000364234200003 | - |
dc.identifier.issnl | 0003-6951 | - |