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Article: Efficient Imaging and Real-Time Display of Scanning Ion Conductance Microscopy Based on Block Compressive Sensing

TitleEfficient Imaging and Real-Time Display of Scanning Ion Conductance Microscopy Based on Block Compressive Sensing
Authors
Keywordsblock matrix part arithmetic
block-dividing method
compressive sensing
scanning ion conductance microscopy
block compressive sensing
Issue Date2014
Citation
International Journal of Optomechatronics, 2014, v. 8, n. 3, p. 218-227 How to Cite?
AbstractScanning Ion Conductance Microscopy (SICM) is one kind of Scanning Probe Microscopies (SPMs), and it is widely used in imaging soft samples for many distinctive advantages. However, the scanning speed of SICM is much slower than other SPMs. Compressive sensing (CS) could improve scanning speed tremendously by breaking through the Shannon sampling theorem, but it still requires too much time in image reconstruction. Block compressive sensing can be applied to SICM imaging to further reduce the reconstruction time of sparse signals, and it has another unique application that it can achieve the function of image real-time display in SICM imaging. In this article, a new method of dividing blocks and a new matrix arithmetic operation were proposed to build the block compressive sensing model, and several experiments were carried out to verify the superiority of block compressive sensing in reducing imaging time and real-time display in SICM imaging. © 2014 Copyright Taylor & Francis Group, LLC.
Persistent Identifierhttp://hdl.handle.net/10722/213414
ISSN
2015 Impact Factor: 0.627
2015 SCImago Journal Rankings: 0.360

 

DC FieldValueLanguage
dc.contributor.authorLi, Gongxin-
dc.contributor.authorLi, Peng-
dc.contributor.authorWang, Yuechao-
dc.contributor.authorWang, Wenxue-
dc.contributor.authorXi, Ning-
dc.contributor.authorLiu, Lianqing-
dc.date.accessioned2015-07-28T04:07:12Z-
dc.date.available2015-07-28T04:07:12Z-
dc.date.issued2014-
dc.identifier.citationInternational Journal of Optomechatronics, 2014, v. 8, n. 3, p. 218-227-
dc.identifier.issn1559-9612-
dc.identifier.urihttp://hdl.handle.net/10722/213414-
dc.description.abstractScanning Ion Conductance Microscopy (SICM) is one kind of Scanning Probe Microscopies (SPMs), and it is widely used in imaging soft samples for many distinctive advantages. However, the scanning speed of SICM is much slower than other SPMs. Compressive sensing (CS) could improve scanning speed tremendously by breaking through the Shannon sampling theorem, but it still requires too much time in image reconstruction. Block compressive sensing can be applied to SICM imaging to further reduce the reconstruction time of sparse signals, and it has another unique application that it can achieve the function of image real-time display in SICM imaging. In this article, a new method of dividing blocks and a new matrix arithmetic operation were proposed to build the block compressive sensing model, and several experiments were carried out to verify the superiority of block compressive sensing in reducing imaging time and real-time display in SICM imaging. © 2014 Copyright Taylor & Francis Group, LLC.-
dc.languageeng-
dc.relation.ispartofInternational Journal of Optomechatronics-
dc.subjectblock matrix part arithmetic-
dc.subjectblock-dividing method-
dc.subjectcompressive sensing-
dc.subjectscanning ion conductance microscopy-
dc.subjectblock compressive sensing-
dc.titleEfficient Imaging and Real-Time Display of Scanning Ion Conductance Microscopy Based on Block Compressive Sensing-
dc.typeArticle-
dc.description.natureLink_to_subscribed_fulltext-
dc.identifier.doi10.1080/15599612.2014.916017-
dc.identifier.scopuseid_2-s2.0-84902958803-
dc.identifier.volume8-
dc.identifier.issue3-
dc.identifier.spage218-
dc.identifier.epage227-
dc.identifier.eissn1559-9620-

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