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Article: Fracture behaviors of a functionally graded thin superconducting film with transport currents based on the strain energy density theory

TitleFracture behaviors of a functionally graded thin superconducting film with transport currents based on the strain energy density theory
Authors
KeywordsCrack
Energy density theory
Functionally graded superconducting film
Transport currents
Issue Date2014
PublisherElsevier BV. The Journal's web site is located at http://www.elsevier.com/locate/tafmec
Citation
Theoretical and Applied Fracture Mechanics, 2014, v. 74, p. 73-78 How to Cite?
AbstractIn this study, the strain energy density theory is used to investigate a central crack problem for a functionally graded superconducting film with the applied transport currents, where the Kim critical state model is adopted and the shear modulus is assumed to vary along the film's width in a form of hyperbolic function. The flux and current densities, the stress intensity factors (SIFs) and energy density factors (EDFs) are all analytically obtained. Numerical results show the effects of applied transport currents, model parameters, and crack length on the EDFs and/or SIFs. Among others, in the process of descending transport current, increasing the graded parameter of shear modulus can inhibit crack propagation, and in general, the crack will propagate and grow into the field of shear modulus decreasing. Moreover, the fracture angle is independent of the applied transport currents, and the fracture angle generally increases slightly with either the increasing of material graded parameter or the increasing of crack length. This study should be useful for the application of superconducting devices.
Persistent Identifierhttp://hdl.handle.net/10722/211730
ISSN
2021 Impact Factor: 4.374
2020 SCImago Journal Rankings: 1.005
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorFeng, WJ-
dc.contributor.authorLiu, QF-
dc.contributor.authorSu, RKL-
dc.date.accessioned2015-07-21T02:09:19Z-
dc.date.available2015-07-21T02:09:19Z-
dc.date.issued2014-
dc.identifier.citationTheoretical and Applied Fracture Mechanics, 2014, v. 74, p. 73-78-
dc.identifier.issn0167-8442-
dc.identifier.urihttp://hdl.handle.net/10722/211730-
dc.description.abstractIn this study, the strain energy density theory is used to investigate a central crack problem for a functionally graded superconducting film with the applied transport currents, where the Kim critical state model is adopted and the shear modulus is assumed to vary along the film's width in a form of hyperbolic function. The flux and current densities, the stress intensity factors (SIFs) and energy density factors (EDFs) are all analytically obtained. Numerical results show the effects of applied transport currents, model parameters, and crack length on the EDFs and/or SIFs. Among others, in the process of descending transport current, increasing the graded parameter of shear modulus can inhibit crack propagation, and in general, the crack will propagate and grow into the field of shear modulus decreasing. Moreover, the fracture angle is independent of the applied transport currents, and the fracture angle generally increases slightly with either the increasing of material graded parameter or the increasing of crack length. This study should be useful for the application of superconducting devices.-
dc.languageeng-
dc.publisherElsevier BV. The Journal's web site is located at http://www.elsevier.com/locate/tafmec-
dc.relation.ispartofTheoretical and Applied Fracture Mechanics-
dc.subjectCrack-
dc.subjectEnergy density theory-
dc.subjectFunctionally graded superconducting film-
dc.subjectTransport currents-
dc.titleFracture behaviors of a functionally graded thin superconducting film with transport currents based on the strain energy density theory-
dc.typeArticle-
dc.identifier.emailSu, RKL: klsu@hkucc.hku.hk-
dc.identifier.authoritySu, RKL=rp00072-
dc.identifier.doi10.1016/j.tafmec.2014.07.002-
dc.identifier.scopuseid_2-s2.0-84922338113-
dc.identifier.hkuros244231-
dc.identifier.volume74-
dc.identifier.spage73-
dc.identifier.epage78-
dc.identifier.isiWOS:000345723000010-
dc.publisher.placeNetherlands-
dc.identifier.issnl0167-8442-

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