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  Patent History
  • Application
    ZL201080019458.1 2010-04-22
  • Granted
    CN 102414988 2012-04-11

granted patent: Methods or structures for reconstruction of substantially uniform samples from substantially nonuniform samples

TitleMethods or structures for reconstruction of substantially uniform samples from substantially nonuniform samples
Granted PatentCN 102414988
Granted Date2012-04-11
Priority Date2009-04-29 US 12/173945P
2010-04-22 PCT/CN2010000549
Inventors
Issue Date2012
Citation
China Patent CN 102414988. Beijing, PRC: State Intellectual Property Office (SIPO) of the P.R.C., 2012 How to Cite?
AbstractBriefly, embodiments of methods or structures for reconstruction of uniform digital signal sample values from nonuniform digital signal sample values are disclosed.
Persistent Identifierhttp://hdl.handle.net/10722/210523

 

DC FieldValueLanguage
dc.date.accessioned2015-06-17T07:03:55Z-
dc.date.available2015-06-17T07:03:55Z-
dc.date.issued2012-
dc.identifier.citationChina Patent CN 102414988. Beijing, PRC: State Intellectual Property Office (SIPO) of the P.R.C., 2012-
dc.identifier.urihttp://hdl.handle.net/10722/210523-
dc.description.abstractBriefly, embodiments of methods or structures for reconstruction of uniform digital signal sample values from nonuniform digital signal sample values are disclosed.-
dc.rightsCreative Commons: Attribution 3.0 Hong Kong License for public patent documents-
dc.titleMethods or structures for reconstruction of substantially uniform samples from substantially nonuniform samples-
dc.typePatent-
dc.identifier.authorityCHAN SHINGCHOW=rp0094-
dc.identifier.authorityTSUI KAIMAN=rp00181-
dc.description.naturepublished_or_final_version-
dc.contributor.inventorCHAN SHINGCHOW-
dc.contributor.inventorTSUI KAIMAN-
patents.identifier.applicationZL201080019458.1-
patents.identifier.applicationCN 2010819458-
patents.identifier.grantedCN 102414988-
patents.description.assigneeUNIV HONG KONG -
patents.description.countryChina, PRC-
patents.date.granted2012-04-11-
patents.identifier.hkutechidEEE-2008-00300-2-
patents.date.application2010-04-22-
patents.date.priority2009-04-29 US 12/173945P-
patents.date.priority2010-04-22 PCT/CN2010000549-
patents.description.cccn-
patents.relation.familyUS 2010281090 (A1) 2010-11-04 -
patents.relation.familyWO 2010124523 (A1) 2010-11-04-
patents.relation.family U S8631059 (B2) 2014-01-14-
patents.description.kindA-
patents.typePatent_granted-

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