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Conference Paper: Effects of Gate-Pulse Shape on the Accuracy of Charge-Pumping Measurement

TitleEffects of Gate-Pulse Shape on the Accuracy of Charge-Pumping Measurement
Authors
Lai, PTXu, JPPoek, CKCheng, YC
Issue Date1997
PublisherThe Secretariat of ICVC '97. The Proceedings' web site is located at http://www.dbpia.co.kr/Journal/ArticleDetail/281804
Citation
Proceedings of the 5th International Conference on VLSI and CAD (ICVC '97), TEMF Hotel, Seoul, Korea, 13-15 October 1997, p. 555-567 How to Cite?
Persistent Identifierhttp://hdl.handle.net/10722/204164
ISBN
9788995004401

 

DC FieldValueLanguage
dc.contributor.authorLai, PT-
dc.contributor.authorXu, JP-
dc.contributor.authorPoek, CK-
dc.contributor.authorCheng, YC-
dc.date.accessioned2014-09-19T20:07:44Z-
dc.date.available2014-09-19T20:07:44Z-
dc.date.issued1997-
dc.identifier.citationProceedings of the 5th International Conference on VLSI and CAD (ICVC '97), TEMF Hotel, Seoul, Korea, 13-15 October 1997, p. 555-567-
dc.identifier.isbn9788995004401-
dc.identifier.urihttp://hdl.handle.net/10722/204164-
dc.languageeng-
dc.publisherThe Secretariat of ICVC '97. The Proceedings' web site is located at http://www.dbpia.co.kr/Journal/ArticleDetail/281804-
dc.relation.ispartofInternational Conference on VLSI and CAD Proceedings-
dc.titleEffects of Gate-Pulse Shape on the Accuracy of Charge-Pumping Measurement-
dc.typeConference_Paper-
dc.identifier.emailLai, PT: laip@eee.hku.hk-
dc.identifier.emailXu, JP: jpxu@eee.hku.hk-
dc.identifier.emailCheng, YC: yccheng@hkucc.hku.hk-
dc.identifier.authorityLai, PT=rp00130-
dc.identifier.authorityXu, JP=rp00197-
dc.identifier.hkuros240644-
dc.identifier.spage555-
dc.identifier.epage567-
dc.publisher.placeSeoul-

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