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Article: Investigating the uneven current injection in perovskite-based thin film bipolar resistance switching devices by thermal Imaging

TitleInvestigating the uneven current injection in perovskite-based thin film bipolar resistance switching devices by thermal Imaging
Authors
Issue Date2014
PublisherInstitute of Electrical and Electronics Engineers. The Journal's web site is located at http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=20
Citation
IEEE Transactions on Magnetics, 2014, v. 50 n. 7, article no. 3000804 How to Cite?
Persistent Identifierhttp://hdl.handle.net/10722/202995
ISSN
2019 Impact Factor: 1.626
2015 SCImago Journal Rankings: 0.602

 

DC FieldValueLanguage
dc.contributor.authorLuo, Zen_US
dc.contributor.authorLau, HKen_US
dc.contributor.authorChan, PKLen_US
dc.contributor.authorLeung, CWen_US
dc.date.accessioned2014-09-19T11:07:38Z-
dc.date.available2014-09-19T11:07:38Z-
dc.date.issued2014en_US
dc.identifier.citationIEEE Transactions on Magnetics, 2014, v. 50 n. 7, article no. 3000804en_US
dc.identifier.issn0018-9464-
dc.identifier.urihttp://hdl.handle.net/10722/202995-
dc.languageengen_US
dc.publisherInstitute of Electrical and Electronics Engineers. The Journal's web site is located at http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=20-
dc.relation.ispartofIEEE Transactions on Magneticsen_US
dc.titleInvestigating the uneven current injection in perovskite-based thin film bipolar resistance switching devices by thermal Imagingen_US
dc.typeArticleen_US
dc.identifier.emailChan, PKL: pklc@hku.hken_US
dc.identifier.authorityChan, PKL=rp01532en_US
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1109/TMAG.2013.2293780-
dc.identifier.scopuseid_2-s2.0-84957579992-
dc.identifier.hkuros235691en_US
dc.identifier.volume50en_US
dc.identifier.issue7en_US
dc.publisher.placeUnited States-

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