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Article: Sub-diffraction imaging of nitrogen-vacancy centers in diamond by stimulated emission depletion and structured illumination

TitleSub-diffraction imaging of nitrogen-vacancy centers in diamond by stimulated emission depletion and structured illumination
Authors
Issue Date2014
Citation
Rsc Advances, 2014, v. 4 n. 22, p. 11305-11310 How to Cite?
AbstractStimulated emission depletion (STED) and structured illumination (SIM) are two commonly used techniques for super-resolution imaging. However, the performance of these two techniques has never been quantitatively compared side-by-side. Taking advantage of the non-photobleaching characteristic of NV centres in fluorescent nanodiamond (FND), we performed a comparative study for the resolution of these two methods with 35 nm FNDs at the single particle level, as well as with FND grown in bulk diamond material. Results show that STED provides more structural details, whereas SIM provides a larger field of view with a higher imaging speed. SIM may induce deconvolution smooth and orientational artifacts during its post-processing.
Persistent Identifierhttp://hdl.handle.net/10722/200680
ISSN
2015 Impact Factor: 3.289
2015 SCImago Journal Rankings: 0.990
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorYang, Xen_US
dc.contributor.authorTzeng, YKen_US
dc.contributor.authorZhu, ZYen_US
dc.contributor.authorHuang, ZHen_US
dc.contributor.authorChen, XZen_US
dc.contributor.authorLiu, YJen_US
dc.contributor.authorChang, HCen_US
dc.contributor.authorHuang, Len_US
dc.contributor.authorLi, Wen_US
dc.contributor.authorXi, Pen_US
dc.date.accessioned2014-08-21T06:54:20Z-
dc.date.available2014-08-21T06:54:20Z-
dc.date.issued2014en_US
dc.identifier.citationRsc Advances, 2014, v. 4 n. 22, p. 11305-11310en_US
dc.identifier.issn2046-2069en_US
dc.identifier.urihttp://hdl.handle.net/10722/200680-
dc.description.abstractStimulated emission depletion (STED) and structured illumination (SIM) are two commonly used techniques for super-resolution imaging. However, the performance of these two techniques has never been quantitatively compared side-by-side. Taking advantage of the non-photobleaching characteristic of NV centres in fluorescent nanodiamond (FND), we performed a comparative study for the resolution of these two methods with 35 nm FNDs at the single particle level, as well as with FND grown in bulk diamond material. Results show that STED provides more structural details, whereas SIM provides a larger field of view with a higher imaging speed. SIM may induce deconvolution smooth and orientational artifacts during its post-processing.en_US
dc.languageengen_US
dc.relation.ispartofRsc Advancesen_US
dc.titleSub-diffraction imaging of nitrogen-vacancy centers in diamond by stimulated emission depletion and structured illuminationen_US
dc.typeArticleen_US
dc.identifier.emailLi, W: liwd@hku.hken_US
dc.identifier.authorityLi, W=rp01581en_US
dc.identifier.doi10.1039/c3ra47240jen_US
dc.identifier.hkuros234709en_US
dc.identifier.volume4en_US
dc.identifier.issue22en_US
dc.identifier.spage11305en_US
dc.identifier.epage11310en_US
dc.identifier.isiWOS:000332469500038-

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