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Conference Paper: A concurrent error detection based fault-tolerant 32 nm XOR-XNOR circuit implementation
Title | A concurrent error detection based fault-tolerant 32 nm XOR-XNOR circuit implementation |
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Authors | |
Keywords | XOR-XNOR circuit Transistor stuck-open fault model Transistor stuck-on fault model Stuck-at fault model Fault-tolerant systems Concurrent Error Detection (CED) |
Issue Date | 2012 |
Citation | International MultiConference of Engineers and Computer Scientists (IMECS), Hong Kong, China, 14-16 March 2012. In Lecture Notes in Engineering and Computer Science, 2012, v. 2, p. 1177-1180 How to Cite? |
Abstract | As modern processors and semiconductor circuits move into 32 nm technologies and below, designers face the major problem of process variations. This problem makes designing VLSI circuits harder and harder, affects the circuit performance and introduces faults that can cause critical failures. Therefore, fault-tolerant design is required to obtain the necessary level of reliability and availability especially for safety-critical systems. Since XOR-XNOR circuits are basic building blocks in various digital and mixed systems, especially in arithmetic circuits, these gates should be designed such that they indicate any malfunction during normal operation. In fact, this property of verifying the results delivered by a circuit during its normal operation is called Concurrent Error Detection (CED). In this paper, we propose a CED based fault- tolerant XOR-XNOR circuit implementation. The proposed design is performed using the 32 nm process technology. |
Persistent Identifier | http://hdl.handle.net/10722/198903 |
ISBN | |
ISSN | 2020 SCImago Journal Rankings: 0.117 |
DC Field | Value | Language |
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dc.contributor.author | Karmani, Mouna | - |
dc.contributor.author | Khedhiri, Chiraz | - |
dc.contributor.author | Hamdi, Belgacem | - |
dc.contributor.author | Man, K. L. | - |
dc.contributor.author | Lim, Enggee | - |
dc.contributor.author | Lei, Chi-Un | - |
dc.date.accessioned | 2014-07-17T03:52:28Z | - |
dc.date.available | 2014-07-17T03:52:28Z | - |
dc.date.issued | 2012 | - |
dc.identifier.citation | International MultiConference of Engineers and Computer Scientists (IMECS), Hong Kong, China, 14-16 March 2012. In Lecture Notes in Engineering and Computer Science, 2012, v. 2, p. 1177-1180 | - |
dc.identifier.isbn | 9789881925190 | - |
dc.identifier.issn | 2078-0958 | - |
dc.identifier.uri | http://hdl.handle.net/10722/198903 | - |
dc.description.abstract | As modern processors and semiconductor circuits move into 32 nm technologies and below, designers face the major problem of process variations. This problem makes designing VLSI circuits harder and harder, affects the circuit performance and introduces faults that can cause critical failures. Therefore, fault-tolerant design is required to obtain the necessary level of reliability and availability especially for safety-critical systems. Since XOR-XNOR circuits are basic building blocks in various digital and mixed systems, especially in arithmetic circuits, these gates should be designed such that they indicate any malfunction during normal operation. In fact, this property of verifying the results delivered by a circuit during its normal operation is called Concurrent Error Detection (CED). In this paper, we propose a CED based fault- tolerant XOR-XNOR circuit implementation. The proposed design is performed using the 32 nm process technology. | - |
dc.language | eng | - |
dc.relation.ispartof | Lecture Notes in Engineering and Computer Science | - |
dc.subject | XOR-XNOR circuit | - |
dc.subject | Transistor stuck-open fault model | - |
dc.subject | Transistor stuck-on fault model | - |
dc.subject | Stuck-at fault model | - |
dc.subject | Fault-tolerant systems | - |
dc.subject | Concurrent Error Detection (CED) | - |
dc.title | A concurrent error detection based fault-tolerant 32 nm XOR-XNOR circuit implementation | - |
dc.type | Conference_Paper | - |
dc.description.nature | published_or_final_version | - |
dc.identifier.scopus | eid_2-s2.0-84867459088 | - |
dc.identifier.hkuros | 230679 | - |
dc.identifier.volume | 2 | - |
dc.identifier.spage | 1177 | - |
dc.identifier.epage | 1180 | - |
dc.identifier.issnl | 2078-0958 | - |