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Conference Paper: Fast single frame super-resolution using scale-invariant self-similarity
Title | Fast single frame super-resolution using scale-invariant self-similarity |
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Authors | |
Issue Date | 2013 |
Publisher | IEEE. The Journal's web site is located at http://ieeexplore.ieee.org/xpl/conhome.jsp?punumber=1000089 |
Citation | The 2013 IEEE International Symposium on Circuits and Systems (ISCAS2013), Beijing, China, 19-23 May 2013. In IEEE International Symposium on Circuits and Systems Proceedings, 2013, p. 1191-1194 How to Cite? |
Abstract | Example-based super-resolution (SR) attracts great interest due to its wide range of applications. However, these algorithms usually involve patch search in a large database or the input image, which is computationally intensive. In this paper, we propose a scale-invariant self-similarity (SiSS) based super-resolution method. Instead of searching patches, we select the patch according to the SiSS measurement, so that the computational complexity is significantly reduced. Multi-shaped and multi-sized patches are used to collect sufficient patches for high-resolution (HR) image reconstruction and a hybrid weighting method is used to suppress the artifacts. Experimental results show that the proposed algorithm is 20~1,800 times faster than several state-of-the-art approaches and can achieve comparable quality. |
Persistent Identifier | http://hdl.handle.net/10722/186795 |
ISBN | |
ISSN |
DC Field | Value | Language |
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dc.contributor.author | Liang, L | en_US |
dc.contributor.author | Chiu, KH | en_US |
dc.contributor.author | Lam, EY | en_US |
dc.date.accessioned | 2013-08-20T12:19:31Z | - |
dc.date.available | 2013-08-20T12:19:31Z | - |
dc.date.issued | 2013 | en_US |
dc.identifier.citation | The 2013 IEEE International Symposium on Circuits and Systems (ISCAS2013), Beijing, China, 19-23 May 2013. In IEEE International Symposium on Circuits and Systems Proceedings, 2013, p. 1191-1194 | en_US |
dc.identifier.isbn | 978-1-4673-5762-3 | - |
dc.identifier.issn | 0271-4302 | - |
dc.identifier.uri | http://hdl.handle.net/10722/186795 | - |
dc.description.abstract | Example-based super-resolution (SR) attracts great interest due to its wide range of applications. However, these algorithms usually involve patch search in a large database or the input image, which is computationally intensive. In this paper, we propose a scale-invariant self-similarity (SiSS) based super-resolution method. Instead of searching patches, we select the patch according to the SiSS measurement, so that the computational complexity is significantly reduced. Multi-shaped and multi-sized patches are used to collect sufficient patches for high-resolution (HR) image reconstruction and a hybrid weighting method is used to suppress the artifacts. Experimental results show that the proposed algorithm is 20~1,800 times faster than several state-of-the-art approaches and can achieve comparable quality. | - |
dc.language | eng | en_US |
dc.publisher | IEEE. The Journal's web site is located at http://ieeexplore.ieee.org/xpl/conhome.jsp?punumber=1000089 | - |
dc.relation.ispartof | IEEE International Symposium on Circuits and Systems Proceedings | en_US |
dc.title | Fast single frame super-resolution using scale-invariant self-similarity | en_US |
dc.type | Conference_Paper | en_US |
dc.identifier.email | Liang, L: luhongliang@astri.org | en_US |
dc.identifier.email | Chiu, KH: khchiu@astri.org | - |
dc.identifier.email | Lam, EY: elam@eee.hku.hk | - |
dc.identifier.authority | Lam, EY=rp00131 | en_US |
dc.description.nature | link_to_subscribed_fulltext | - |
dc.identifier.doi | 10.1109/ISCAS.2013.6572065 | - |
dc.identifier.scopus | eid_2-s2.0-84883373843 | - |
dc.identifier.hkuros | 220501 | en_US |
dc.identifier.spage | 1191 | - |
dc.identifier.epage | 1194 | - |
dc.publisher.place | United States | - |
dc.customcontrol.immutable | sml 130903 | - |
dc.identifier.issnl | 0271-4302 | - |