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Conference Paper: Fast single frame super-resolution using scale-invariant self-similarity

TitleFast single frame super-resolution using scale-invariant self-similarity
Authors
Issue Date2013
PublisherIEEE. The Journal's web site is located at http://ieeexplore.ieee.org/xpl/conhome.jsp?punumber=1000089
Citation
The 2013 IEEE International Symposium on Circuits and Systems (ISCAS2013), Beijing, China, 19-23 May 2013. In IEEE International Symposium on Circuits and Systems Proceedings, 2013, p. 1191-1194 How to Cite?
AbstractExample-based super-resolution (SR) attracts great interest due to its wide range of applications. However, these algorithms usually involve patch search in a large database or the input image, which is computationally intensive. In this paper, we propose a scale-invariant self-similarity (SiSS) based super-resolution method. Instead of searching patches, we select the patch according to the SiSS measurement, so that the computational complexity is significantly reduced. Multi-shaped and multi-sized patches are used to collect sufficient patches for high-resolution (HR) image reconstruction and a hybrid weighting method is used to suppress the artifacts. Experimental results show that the proposed algorithm is 201,800 times faster than several state-of-the-art approaches and can achieve comparable quality.
Persistent Identifierhttp://hdl.handle.net/10722/186795
ISBN
ISSN

 

DC FieldValueLanguage
dc.contributor.authorLiang, Len_US
dc.contributor.authorChiu, KHen_US
dc.contributor.authorLam, EYen_US
dc.date.accessioned2013-08-20T12:19:31Z-
dc.date.available2013-08-20T12:19:31Z-
dc.date.issued2013en_US
dc.identifier.citationThe 2013 IEEE International Symposium on Circuits and Systems (ISCAS2013), Beijing, China, 19-23 May 2013. In IEEE International Symposium on Circuits and Systems Proceedings, 2013, p. 1191-1194en_US
dc.identifier.isbn978-1-4673-5762-3-
dc.identifier.issn0271-4302-
dc.identifier.urihttp://hdl.handle.net/10722/186795-
dc.description.abstractExample-based super-resolution (SR) attracts great interest due to its wide range of applications. However, these algorithms usually involve patch search in a large database or the input image, which is computationally intensive. In this paper, we propose a scale-invariant self-similarity (SiSS) based super-resolution method. Instead of searching patches, we select the patch according to the SiSS measurement, so that the computational complexity is significantly reduced. Multi-shaped and multi-sized patches are used to collect sufficient patches for high-resolution (HR) image reconstruction and a hybrid weighting method is used to suppress the artifacts. Experimental results show that the proposed algorithm is 201,800 times faster than several state-of-the-art approaches and can achieve comparable quality.-
dc.languageengen_US
dc.publisherIEEE. The Journal's web site is located at http://ieeexplore.ieee.org/xpl/conhome.jsp?punumber=1000089-
dc.relation.ispartofIEEE International Symposium on Circuits and Systems Proceedingsen_US
dc.rightsIEEE International Symposium on Circuits and Systems Proceedings. Copyright © IEEE.-
dc.rights©2013 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.-
dc.rightsCreative Commons: Attribution 3.0 Hong Kong License-
dc.titleFast single frame super-resolution using scale-invariant self-similarityen_US
dc.typeConference_Paperen_US
dc.identifier.emailLiang, L: luhongliang@astri.orgen_US
dc.identifier.emailChiu, KH: khchiu@astri.org-
dc.identifier.emailLam, EY: elam@eee.hku.hk-
dc.identifier.authorityLam, EY=rp00131en_US
dc.description.naturepublished_or_final_version-
dc.identifier.hkuros220501en_US
dc.identifier.spage1191-
dc.identifier.epage1194-
dc.publisher.placeUnited States-
dc.customcontrol.immutablesml 130903-

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