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Conference Paper: Skin-Effect Model for Round Wires in PEEC

TitleSkin-Effect Model for Round Wires in PEEC
Authors
Issue Date2012
PublisherI E E E.
Citation
International Symposium on Electromagnetic Compatibility (EMC EUROPE 2012), Rome, Italy, 17-21 September 2012. In International Symposium on Electromagnetic Compatibility Porceedings, 2012, p. 1-6, article no. 6396927 How to Cite?
AbstractIn this paper we consider the skin- and radiation effects for a thin wire segment. Circuit models are being constructed which are suitable for the modeling of thin wires like the wire bonds. We use the internal-external inductance model for this purpose of including the skin-effect in the partial inductance. These models make it possible to include thin, round conductors in a PEEC model at a much lower cost in compute time. The ultimate goal is to construct a circuit model which can be applied both in the time and frequency domain to signal and power integrity problems. © 2012 IEEE.
Persistent Identifierhttp://hdl.handle.net/10722/186727
ISBN
ISSN

 

DC FieldValueLanguage
dc.contributor.authorRuehli, A.Een_US
dc.contributor.authorAntonini, G.en_US
dc.contributor.authorJiang, Len_US
dc.date.accessioned2013-08-20T12:19:15Z-
dc.date.available2013-08-20T12:19:15Z-
dc.date.issued2012en_US
dc.identifier.citationInternational Symposium on Electromagnetic Compatibility (EMC EUROPE 2012), Rome, Italy, 17-21 September 2012. In International Symposium on Electromagnetic Compatibility Porceedings, 2012, p. 1-6, article no. 6396927en_US
dc.identifier.isbn9781467307185-
dc.identifier.issn2325-0356-
dc.identifier.urihttp://hdl.handle.net/10722/186727-
dc.description.abstractIn this paper we consider the skin- and radiation effects for a thin wire segment. Circuit models are being constructed which are suitable for the modeling of thin wires like the wire bonds. We use the internal-external inductance model for this purpose of including the skin-effect in the partial inductance. These models make it possible to include thin, round conductors in a PEEC model at a much lower cost in compute time. The ultimate goal is to construct a circuit model which can be applied both in the time and frequency domain to signal and power integrity problems. © 2012 IEEE.-
dc.languageengen_US
dc.publisherI E E E.en_US
dc.relation.ispartofInternational Symposium on Electromagnetic Compatibilityen_US
dc.rightsInternational Symposium on Electromagnetic Compatibility. Copyright © I E E E.en_US
dc.rights©2012 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.en_US
dc.rightsCreative Commons: Attribution 3.0 Hong Kong License-
dc.titleSkin-Effect Model for Round Wires in PEECen_US
dc.typeConference_Paperen_US
dc.identifier.emailJiang, L: jianglj@hku.hken_US
dc.identifier.authorityJiang, L=rp01338en_US
dc.description.naturepublished_or_final_version-
dc.identifier.doi10.1109/EMCEurope.2012.6396927-
dc.identifier.scopuseid_2-s2.0-84872568368-
dc.identifier.hkuros218866en_US
dc.identifier.spage1, article no. 6396927en_US
dc.identifier.epage6, article no. 6396927en_US
dc.publisher.placeUnited States-

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