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Article: Transient sensitivity of sectorial split-drain magnetic field-effect transistor

TitleTransient sensitivity of sectorial split-drain magnetic field-effect transistor
Authors
Issue Date2013
PublisherInstitute of Electrical and Electronics Engineers. The Journal's web site is located at http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=20
Citation
IEEE Transactions on Magnetics, 2013, v. 49 n. 7, p. 4048-4051 How to Cite?
Persistent Identifierhttp://hdl.handle.net/10722/185883
ISSN
2015 Impact Factor: 1.277
2015 SCImago Journal Rankings: 0.602
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorYang, Zen_US
dc.contributor.authorSiu, Sen_US
dc.contributor.authorTam, Wen_US
dc.contributor.authorKok, Cen_US
dc.contributor.authorLeung, CWen_US
dc.contributor.authorLai, PTen_US
dc.contributor.authorWong, Hen_US
dc.contributor.authorPong, PWT-
dc.date.accessioned2013-08-20T11:44:14Z-
dc.date.available2013-08-20T11:44:14Z-
dc.date.issued2013en_US
dc.identifier.citationIEEE Transactions on Magnetics, 2013, v. 49 n. 7, p. 4048-4051en_US
dc.identifier.issn0018-9464-
dc.identifier.urihttp://hdl.handle.net/10722/185883-
dc.languageengen_US
dc.publisherInstitute of Electrical and Electronics Engineers. The Journal's web site is located at http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=20-
dc.relation.ispartofIEEE Transactions on Magneticsen_US
dc.rightsIEEE Transactions on Magnetics. Copyright © Institute of Electrical and Electronics Engineers.-
dc.rights©2013 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.-
dc.rightsCreative Commons: Attribution 3.0 Hong Kong License-
dc.titleTransient sensitivity of sectorial split-drain magnetic field-effect transistoren_US
dc.typeArticleen_US
dc.identifier.emailPong, PWT: ppong@eee.hku.hken_US
dc.identifier.authorityPong, PWT=rp00217en_US
dc.description.naturepublished_or_final_version-
dc.identifier.doi10.1109/TMAG.2013.2241034-
dc.identifier.scopuseid_2-s2.0-84880822810-
dc.identifier.hkuros219728en_US
dc.identifier.volume49en_US
dc.identifier.issue7-
dc.identifier.spage4048en_US
dc.identifier.epage4051en_US
dc.identifier.isiWOS:000322483200247-
dc.publisher.placeUnited States-

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