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Article: Skin-Effect Loss Models for Time- and Frequency-Domain PEEC Solver

TitleSkin-Effect Loss Models for Time- and Frequency-Domain PEEC Solver
Authors
Ruehli, A.EAntonini, G.Jiang, L
KeywordsModified nodal analysis (MNA)
noise integrity (NI)
partial element equivalent circuit (PEEC)
power integrity (PI)
signal integrity (SI)
transmission line (TL)
Issue Date2013
Citation
Proceedings of the IEEE, 2013, v. 101 n. 2, p. 451-472 How to Cite?
DOI: http://dx.doi.org/10.1109/JPROC.2012.2220312
Persistent Identifierhttp://hdl.handle.net/10722/185860
ISSN
0018-9219
2023 Impact Factor: 23.2
2023 SCImago Journal Rankings: 6.085
ISI Accession Number ID
WOS:000313724400019

 

DC FieldValueLanguage
dc.contributor.authorRuehli, A.Een_US
dc.contributor.authorAntonini, G.en_US
dc.contributor.authorJiang, Len_US
dc.date.accessioned2013-08-20T11:44:02Z-
dc.date.available2013-08-20T11:44:02Z-
dc.date.issued2013en_US
dc.identifier.citationProceedings of the IEEE, 2013, v. 101 n. 2, p. 451-472en_US
dc.identifier.issn0018-9219-
dc.identifier.urihttp://hdl.handle.net/10722/185860-
dc.languageengen_US
dc.relation.ispartofProceedings of the IEEEen_US
dc.subjectModified nodal analysis (MNA)-
dc.subjectnoise integrity (NI)-
dc.subjectpartial element equivalent circuit (PEEC)-
dc.subjectpower integrity (PI)-
dc.subjectsignal integrity (SI)-
dc.subjecttransmission line (TL)-
dc.titleSkin-Effect Loss Models for Time- and Frequency-Domain PEEC Solveren_US
dc.typeArticleen_US
dc.identifier.emailJiang, L: jianglj@hku.hken_US
dc.identifier.authorityJiang, L=rp01338en_US
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1109/JPROC.2012.2220312-
dc.identifier.scopuseid_2-s2.0-84872611209-
dc.identifier.hkuros218843en_US
dc.identifier.volume101en_US
dc.identifier.issue2-
dc.identifier.spage451en_US
dc.identifier.epage472en_US
dc.identifier.eissn1558-2256-
dc.identifier.isiWOS:000313724400019-
dc.identifier.issnl0018-9219-

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