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- Publisher Website: 10.1021/es060831q
- Scopus: eid_2-s2.0-33845303213
- PMID: 17180987
- WOS: WOS:000242367100040
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Article: Use of reverse osmosis membranes to remove perfluorooctane sulfonate (PFOS) from semiconductor wastewater
Title | Use of reverse osmosis membranes to remove perfluorooctane sulfonate (PFOS) from semiconductor wastewater |
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Authors | |
Issue Date | 2006 |
Publisher | American Chemical Society. The Journal's web site is located at http://pubs.acs.org/est |
Citation | Environmental Science And Technology, 2006, v. 40 n. 23, p. 7343-7349 How to Cite? |
Abstract | Perfluorooctane sulfonate (PFOS) and related substances are persistent, bioaccumulative, and toxic, and thus of substantial environmental concern. PFOS is an essential photolithographic chemical in the semiconductor industry with no substitutes yet identified. The industry seeks effective treatment technologies. The feasibility of using reverse osmosis (RO) membranes for treating semiconductor wastewater containing PFOS has been investigated. Commercial RO membranes were characterized in terms of permeability, salt rejection, scanning electron microscopy (SEM), transmission electron microscopy (TEM), and membrane surface zeta potential (streaming potential measurements). Filtration tests were performed to determine the membrane flux and PFOS rejection. Over a wide range of feed concentrations (0.5 - 1500 ppm), the RO membranes generally rejected 99% or more of the PFOS. Rejection was better for tighter membranes, but was not affected by membrane zeta potential. Flux decreased with increasing PFOS concentration. While the flux reduction was severe for a loose RO membrane probably due to its higher initial flux, very stable flux was maintained for tighter membranes. At a very high feed concentration (about 500 ppm), all the membranes exhibited an identical stable flux. Isopropyl alcohol, present in some semiconductor wastewaters, had a detrimental effect on membrane flux. Where present it needs to be removed from the wastewater prior to using RO membranes. © 2006 American Chemical Society. |
Persistent Identifier | http://hdl.handle.net/10722/185373 |
ISSN | 2023 Impact Factor: 10.8 2023 SCImago Journal Rankings: 3.516 |
ISI Accession Number ID | |
References |
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Tang, CY | en_US |
dc.contributor.author | Fu, QS | en_US |
dc.contributor.author | Robertson, AP | en_US |
dc.contributor.author | Criddle, CS | en_US |
dc.contributor.author | Leckie, JO | en_US |
dc.date.accessioned | 2013-07-30T07:32:01Z | - |
dc.date.available | 2013-07-30T07:32:01Z | - |
dc.date.issued | 2006 | en_US |
dc.identifier.citation | Environmental Science And Technology, 2006, v. 40 n. 23, p. 7343-7349 | en_US |
dc.identifier.issn | 0013-936X | en_US |
dc.identifier.uri | http://hdl.handle.net/10722/185373 | - |
dc.description.abstract | Perfluorooctane sulfonate (PFOS) and related substances are persistent, bioaccumulative, and toxic, and thus of substantial environmental concern. PFOS is an essential photolithographic chemical in the semiconductor industry with no substitutes yet identified. The industry seeks effective treatment technologies. The feasibility of using reverse osmosis (RO) membranes for treating semiconductor wastewater containing PFOS has been investigated. Commercial RO membranes were characterized in terms of permeability, salt rejection, scanning electron microscopy (SEM), transmission electron microscopy (TEM), and membrane surface zeta potential (streaming potential measurements). Filtration tests were performed to determine the membrane flux and PFOS rejection. Over a wide range of feed concentrations (0.5 - 1500 ppm), the RO membranes generally rejected 99% or more of the PFOS. Rejection was better for tighter membranes, but was not affected by membrane zeta potential. Flux decreased with increasing PFOS concentration. While the flux reduction was severe for a loose RO membrane probably due to its higher initial flux, very stable flux was maintained for tighter membranes. At a very high feed concentration (about 500 ppm), all the membranes exhibited an identical stable flux. Isopropyl alcohol, present in some semiconductor wastewaters, had a detrimental effect on membrane flux. Where present it needs to be removed from the wastewater prior to using RO membranes. © 2006 American Chemical Society. | en_US |
dc.language | eng | en_US |
dc.publisher | American Chemical Society. The Journal's web site is located at http://pubs.acs.org/est | en_US |
dc.relation.ispartof | Environmental Science and Technology | en_US |
dc.subject.mesh | Alkanesulfonic Acids - Analysis - Chemistry | en_US |
dc.subject.mesh | Fluorocarbons - Analysis - Chemistry | en_US |
dc.subject.mesh | Membranes, Artificial | en_US |
dc.subject.mesh | Microscopy, Electron | en_US |
dc.subject.mesh | Osmotic Pressure | en_US |
dc.subject.mesh | Semiconductors | en_US |
dc.subject.mesh | Waste Disposal, Fluid - Methods | en_US |
dc.subject.mesh | Water Pollutants, Chemical - Analysis | en_US |
dc.subject.mesh | Water Purification - Methods | en_US |
dc.title | Use of reverse osmosis membranes to remove perfluorooctane sulfonate (PFOS) from semiconductor wastewater | en_US |
dc.type | Article | en_US |
dc.identifier.email | Tang, CY: tangc@hku.hk | en_US |
dc.identifier.authority | Tang, CY=rp01765 | en_US |
dc.description.nature | link_to_subscribed_fulltext | en_US |
dc.identifier.doi | 10.1021/es060831q | en_US |
dc.identifier.pmid | 17180987 | - |
dc.identifier.scopus | eid_2-s2.0-33845303213 | en_US |
dc.relation.references | http://www.scopus.com/mlt/select.url?eid=2-s2.0-33845303213&selection=ref&src=s&origin=recordpage | en_US |
dc.identifier.volume | 40 | en_US |
dc.identifier.issue | 23 | en_US |
dc.identifier.spage | 7343 | en_US |
dc.identifier.epage | 7349 | en_US |
dc.identifier.isi | WOS:000242367100040 | - |
dc.publisher.place | United States | en_US |
dc.identifier.scopusauthorid | Tang, CY=35489259800 | en_US |
dc.identifier.scopusauthorid | Fu, QS=13606617700 | en_US |
dc.identifier.scopusauthorid | Robertson, AP=15766200200 | en_US |
dc.identifier.scopusauthorid | Criddle, CS=7004173112 | en_US |
dc.identifier.scopusauthorid | Leckie, JO=7006717360 | en_US |
dc.identifier.issnl | 0013-936X | - |