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Conference Paper: Effects of residual and tunable strain in thin films of La0.7Ba0.3MnO3

TitleEffects of residual and tunable strain in thin films of La0.7Ba0.3MnO3
Authors
Issue Date2013
PublisherAmerican Institute of Physics. The Journal's web site is located at http://jap.aip.org/jap/staff.jsp
Citation
12th Joint MMM-Intermag Conference. In Journal of Applied Physics, 2013, v. 113, p. 17D911 How to Cite?
Persistent Identifierhttp://hdl.handle.net/10722/183790

 

DC FieldValueLanguage
dc.contributor.authorWang, Jen_US
dc.contributor.authorJiang, Yen_US
dc.contributor.authorWu, Zen_US
dc.contributor.authorGao, Jen_US
dc.date.accessioned2013-06-18T04:14:50Z-
dc.date.available2013-06-18T04:14:50Z-
dc.date.issued2013en_US
dc.identifier.citation12th Joint MMM-Intermag Conference. In Journal of Applied Physics, 2013, v. 113, p. 17D911en_US
dc.identifier.urihttp://hdl.handle.net/10722/183790-
dc.languageengen_US
dc.publisherAmerican Institute of Physics. The Journal's web site is located at http://jap.aip.org/jap/staff.jspen_US
dc.relation.ispartofJournal of Applied Physicsen_US
dc.rightsJournal of Applied Physics. Copyright © American Institute of Physics.en_US
dc.rightsCopyright (2013) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in (Journal of Applied Physics, 2013, v. 113, p. 17D911) and may be found at (http://jap.aip.org/resource/1/japiau/v113/i17/p17D911_s1).en_US
dc.rightsCreative Commons: Attribution 3.0 Hong Kong License-
dc.titleEffects of residual and tunable strain in thin films of La0.7Ba0.3MnO3en_US
dc.typeConference_Paperen_US
dc.identifier.emailWang, J: jfwwang@hku.hken_US
dc.identifier.emailWu, Z: zpwuhku@hku.hken_US
dc.identifier.emailGao, J: jugao@hku.hken_US
dc.identifier.authorityGao, J=rp00699en_US
dc.description.naturepublished_or_final_version-
dc.identifier.hkuros214836en_US
dc.identifier.volume113en_US
dc.identifier.spage17D911en_US
dc.identifier.epage17D911en_US

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