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Conference Paper: Simple fabrication method for ZnO nanoneedle structures

TitleSimple fabrication method for ZnO nanoneedle structures
Authors
KeywordsNanostructures
Zno
Issue Date2005
Citation
Conference On Optoelectronic And Microelectronic Materials And Devices, Proceedings, Commad, 2005, p. 173-176 How to Cite?
AbstractIn this work, we demonstrated a simple synthesis method for ZnO nanoneedle structures which were fabricated at atmospheric pressure. Nanoneedles with diameter in the range 20-40 nm were synthesized in a tube furnace maintained at 800°C by evaporation of Zn nanoparticles in humidified Ar flow at 0.25 1pm. The nanostructures were grown on Si substrates at 725-750°C without any catalyst. The fabricated needle structures show strong UV photoluminescence and weak yellow/orange emission, which indicates the excellent crystal quality of the nanostructures. X-ray diffraction (XRD) found only peaks corresponding to hexagonal ZnO. No peaks from Zn or other impurities were found. © 2005 IEEE.
Persistent Identifierhttp://hdl.handle.net/10722/176191
References

 

DC FieldValueLanguage
dc.contributor.authorLeung, YHen_US
dc.contributor.authorDjurišić, ABen_US
dc.contributor.authorXie, MHen_US
dc.date.accessioned2012-11-26T09:06:43Z-
dc.date.available2012-11-26T09:06:43Z-
dc.date.issued2005en_US
dc.identifier.citationConference On Optoelectronic And Microelectronic Materials And Devices, Proceedings, Commad, 2005, p. 173-176en_US
dc.identifier.urihttp://hdl.handle.net/10722/176191-
dc.description.abstractIn this work, we demonstrated a simple synthesis method for ZnO nanoneedle structures which were fabricated at atmospheric pressure. Nanoneedles with diameter in the range 20-40 nm were synthesized in a tube furnace maintained at 800°C by evaporation of Zn nanoparticles in humidified Ar flow at 0.25 1pm. The nanostructures were grown on Si substrates at 725-750°C without any catalyst. The fabricated needle structures show strong UV photoluminescence and weak yellow/orange emission, which indicates the excellent crystal quality of the nanostructures. X-ray diffraction (XRD) found only peaks corresponding to hexagonal ZnO. No peaks from Zn or other impurities were found. © 2005 IEEE.en_US
dc.languageengen_US
dc.relation.ispartofConference on Optoelectronic and Microelectronic Materials and Devices, Proceedings, COMMADen_US
dc.subjectNanostructuresen_US
dc.subjectZnoen_US
dc.titleSimple fabrication method for ZnO nanoneedle structuresen_US
dc.typeConference_Paperen_US
dc.identifier.emailDjurišić, AB: dalek@hku.hken_US
dc.identifier.emailXie, MH: mhxie@hku.hken_US
dc.identifier.authorityDjurišić, AB=rp00690en_US
dc.identifier.authorityXie, MH=rp00818en_US
dc.description.naturelink_to_subscribed_fulltexten_US
dc.identifier.doi10.1109/COMMAD.2004.1577520en_US
dc.identifier.scopuseid_2-s2.0-46149088477en_US
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-46149088477&selection=ref&src=s&origin=recordpageen_US
dc.identifier.spage173en_US
dc.identifier.epage176en_US
dc.identifier.scopusauthoridLeung, YH=7201463866en_US
dc.identifier.scopusauthoridDjurišić, AB=7004904830en_US
dc.identifier.scopusauthoridXie, MH=7202255416en_US

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