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Conference Paper: Optical properties of 3,4,9,10-perylenetetracarboxylic dianhidride (PTCDA)

TitleOptical properties of 3,4,9,10-perylenetetracarboxylic dianhidride (PTCDA)
Authors
KeywordsOrganic Thin Films
Ptcda
Issue Date2001
PublisherS P I E - International Society for Optical Engineering. The Journal's web site is located at http://spie.org/x1848.xml
Citation
Proceedings Of Spie - The International Society For Optical Engineering, 2001, v. 4580, p. 322-329 How to Cite?
AbstractWe have used spectroscopic ellipsometry (SE) to determine the optical functions of PTCDA. The samples have been prepared by thermal evaporation of PTCDA on quartz glass substrates. We have also investigated influence of the substrate temperature to the properties of PTCDA films. We have found that the surface roughness of the films, determined by atomic force microscopy, increases with the increase of substrate temperature. The lowest substrate temperature investigated here is the room temperature. At room temperature and higher substrate temperatures we have not observed ordering of the evaporated films (ordering would result in high anisotropy) which has been reported for PTCDA films grown by organic molecular beam deposition at very low temperatures (so called quasi-epitaxial growth). Therefore, the samples have been assumed to be isotropic. The obtained imaginary part of the dielectric function exhibits the expected features, i.e. low magnitude peak around 370 nm and higher magnitude two peak structure in 400-600 nm spectral region. The dielectric function spectra of the samples grown at room temperature and at 100°C have been compared and discussed.
Persistent Identifierhttp://hdl.handle.net/10722/176162
ISSN
References

 

DC FieldValueLanguage
dc.contributor.authorKwong, CYen_US
dc.contributor.authorDjurišić, ABen_US
dc.contributor.authorGuo, WLen_US
dc.contributor.authorLi, EHen_US
dc.contributor.authorLiu, ZTen_US
dc.contributor.authorKwok, HSen_US
dc.date.accessioned2012-11-26T09:06:31Z-
dc.date.available2012-11-26T09:06:31Z-
dc.date.issued2001en_US
dc.identifier.citationProceedings Of Spie - The International Society For Optical Engineering, 2001, v. 4580, p. 322-329en_US
dc.identifier.issn0277-786Xen_US
dc.identifier.urihttp://hdl.handle.net/10722/176162-
dc.description.abstractWe have used spectroscopic ellipsometry (SE) to determine the optical functions of PTCDA. The samples have been prepared by thermal evaporation of PTCDA on quartz glass substrates. We have also investigated influence of the substrate temperature to the properties of PTCDA films. We have found that the surface roughness of the films, determined by atomic force microscopy, increases with the increase of substrate temperature. The lowest substrate temperature investigated here is the room temperature. At room temperature and higher substrate temperatures we have not observed ordering of the evaporated films (ordering would result in high anisotropy) which has been reported for PTCDA films grown by organic molecular beam deposition at very low temperatures (so called quasi-epitaxial growth). Therefore, the samples have been assumed to be isotropic. The obtained imaginary part of the dielectric function exhibits the expected features, i.e. low magnitude peak around 370 nm and higher magnitude two peak structure in 400-600 nm spectral region. The dielectric function spectra of the samples grown at room temperature and at 100°C have been compared and discussed.en_US
dc.languageengen_US
dc.publisherS P I E - International Society for Optical Engineering. The Journal's web site is located at http://spie.org/x1848.xmlen_US
dc.relation.ispartofProceedings of SPIE - The International Society for Optical Engineeringen_US
dc.subjectOrganic Thin Filmsen_US
dc.subjectPtcdaen_US
dc.titleOptical properties of 3,4,9,10-perylenetetracarboxylic dianhidride (PTCDA)en_US
dc.typeConference_Paperen_US
dc.identifier.emailDjurišić, AB: dalek@hku.hken_US
dc.identifier.authorityDjurišić, AB=rp00690en_US
dc.description.naturelink_to_subscribed_fulltexten_US
dc.identifier.doi10.1117/12.444980en_US
dc.identifier.scopuseid_2-s2.0-0035779224en_US
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-0035779224&selection=ref&src=s&origin=recordpageen_US
dc.identifier.volume4580en_US
dc.identifier.spage322en_US
dc.identifier.epage329en_US
dc.publisher.placeUnited Statesen_US
dc.identifier.scopusauthoridKwong, CY=35917741900en_US
dc.identifier.scopusauthoridDjurišić, AB=7004904830en_US
dc.identifier.scopusauthoridGuo, WL=7401967943en_US
dc.identifier.scopusauthoridLi, EH=7201410087en_US
dc.identifier.scopusauthoridLiu, ZT=22934686400en_US
dc.identifier.scopusauthoridKwok, HS=36071953500en_US

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