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Article: Determination of optical constants of thin absorbing films from normal incidence reflectance and transmittance measurements

TitleDetermination of optical constants of thin absorbing films from normal incidence reflectance and transmittance measurements
Authors
Issue Date1999
PublisherElsevier BV. The Journal's web site is located at http://www.elsevier.com/locate/optcom
Citation
Optics Communications, 1999, v. 166 n. 1, p. 35-42 How to Cite?
AbstractIn this work, we propose a method for calculating the real and imaginary part of the index of refraction N = n-ik and the film thickness d of absorbing thin films from normal incidence reflectance R and transmittance T measurements. The method determines the film thickness and the index of refraction values at all experimental points simultaneously, utilizing the fact that both the real and imaginary parts of the index of refraction are continuous functions. We test the ability of our method to extract correct d, n, and k values from two test datasets of R and T data generated from known n and k values. One of the test datasets contains random noise up to ±1.5% for R and ±0.5% for T, emulating random experimental errors. After verifying that our method is capable of accurate and reliable estimation of the index of refraction, we apply it to the determination of optical constants of thin films of the organic dye N,N′-dimethylperylene-3,4:9,10-dicarboximide.
Persistent Identifierhttp://hdl.handle.net/10722/174878
ISSN
2015 Impact Factor: 1.48
2015 SCImago Journal Rankings: 0.778
ISI Accession Number ID
References

 

DC FieldValueLanguage
dc.contributor.authorDjurišić, ABen_US
dc.contributor.authorFritz, Ten_US
dc.contributor.authorLeo, Ken_US
dc.date.accessioned2012-11-26T08:47:56Z-
dc.date.available2012-11-26T08:47:56Z-
dc.date.issued1999en_US
dc.identifier.citationOptics Communications, 1999, v. 166 n. 1, p. 35-42en_US
dc.identifier.issn0030-4018en_US
dc.identifier.urihttp://hdl.handle.net/10722/174878-
dc.description.abstractIn this work, we propose a method for calculating the real and imaginary part of the index of refraction N = n-ik and the film thickness d of absorbing thin films from normal incidence reflectance R and transmittance T measurements. The method determines the film thickness and the index of refraction values at all experimental points simultaneously, utilizing the fact that both the real and imaginary parts of the index of refraction are continuous functions. We test the ability of our method to extract correct d, n, and k values from two test datasets of R and T data generated from known n and k values. One of the test datasets contains random noise up to ±1.5% for R and ±0.5% for T, emulating random experimental errors. After verifying that our method is capable of accurate and reliable estimation of the index of refraction, we apply it to the determination of optical constants of thin films of the organic dye N,N′-dimethylperylene-3,4:9,10-dicarboximide.en_US
dc.languageengen_US
dc.publisherElsevier BV. The Journal's web site is located at http://www.elsevier.com/locate/optcomen_US
dc.relation.ispartofOptics Communicationsen_US
dc.titleDetermination of optical constants of thin absorbing films from normal incidence reflectance and transmittance measurementsen_US
dc.typeArticleen_US
dc.identifier.emailDjurišić, AB: dalek@hku.hken_US
dc.identifier.authorityDjurišić, AB=rp00690en_US
dc.description.naturelink_to_subscribed_fulltexten_US
dc.identifier.doi10.1016/S0030-4018(99)00246-1en_US
dc.identifier.scopuseid_2-s2.0-0343004290en_US
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-0343004290&selection=ref&src=s&origin=recordpageen_US
dc.identifier.volume166en_US
dc.identifier.issue1en_US
dc.identifier.spage35en_US
dc.identifier.epage42en_US
dc.identifier.isiWOS:000081812900006-
dc.publisher.placeNetherlandsen_US
dc.identifier.scopusauthoridDjurišić, AB=7004904830en_US
dc.identifier.scopusauthoridFritz, T=7102033452en_US
dc.identifier.scopusauthoridLeo, K=7006009729en_US

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