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Article: The design of reflective filters based on AlxGa1-xN multilayers

TitleThe design of reflective filters based on AlxGa1-xN multilayers
Authors
Issue Date2001
PublisherInstitute of Physics Publishing. The Journal's web site is located at http://www.iop.org/journals/sst
Citation
Semiconductor Science And Technology, 2001, v. 16 n. 2, p. 91-97 How to Cite?
AbstractIn this work we report a method for designing reflective filters based on AlxGa1-xN multilayers. Reflective filters have been designed using a genetic algorithm. The algorithm finds the optimal thickness and composition of each layer for a specified number of layers in order to achieve the desired reflectance characteristics over the specified wavelength range. The calculations take into account the dependence of both the real and imaginary parts of the index of refraction on wavelength and composition. The method is highly versatile, since it also enables the incorporation of constraints such as the limitation of the composition difference of the adjacent layers, so that lattice mismatch can be small. This feature is particularly important due to the large lattice mismatch between GaN and AlN, which causes surface roughness in AlN/GaN structures and consequently lower reflectance than that calculated.
Persistent Identifierhttp://hdl.handle.net/10722/174875
ISSN
2015 Impact Factor: 2.098
2015 SCImago Journal Rankings: 0.676
ISI Accession Number ID
References

 

DC FieldValueLanguage
dc.contributor.authorDjurišić, ABen_US
dc.contributor.authorBundaleski, NKen_US
dc.contributor.authorLi, EHen_US
dc.date.accessioned2012-11-26T08:47:55Z-
dc.date.available2012-11-26T08:47:55Z-
dc.date.issued2001en_US
dc.identifier.citationSemiconductor Science And Technology, 2001, v. 16 n. 2, p. 91-97en_US
dc.identifier.issn0268-1242en_US
dc.identifier.urihttp://hdl.handle.net/10722/174875-
dc.description.abstractIn this work we report a method for designing reflective filters based on AlxGa1-xN multilayers. Reflective filters have been designed using a genetic algorithm. The algorithm finds the optimal thickness and composition of each layer for a specified number of layers in order to achieve the desired reflectance characteristics over the specified wavelength range. The calculations take into account the dependence of both the real and imaginary parts of the index of refraction on wavelength and composition. The method is highly versatile, since it also enables the incorporation of constraints such as the limitation of the composition difference of the adjacent layers, so that lattice mismatch can be small. This feature is particularly important due to the large lattice mismatch between GaN and AlN, which causes surface roughness in AlN/GaN structures and consequently lower reflectance than that calculated.en_US
dc.languageengen_US
dc.publisherInstitute of Physics Publishing. The Journal's web site is located at http://www.iop.org/journals/ssten_US
dc.relation.ispartofSemiconductor Science and Technologyen_US
dc.titleThe design of reflective filters based on AlxGa1-xN multilayersen_US
dc.typeArticleen_US
dc.identifier.emailDjurišić, AB: dalek@hku.hken_US
dc.identifier.authorityDjurišić, AB=rp00690en_US
dc.description.naturelink_to_subscribed_fulltexten_US
dc.identifier.doi10.1088/0268-1242/16/2/306en_US
dc.identifier.scopuseid_2-s2.0-0342854204en_US
dc.identifier.hkuros63748-
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-0342854204&selection=ref&src=s&origin=recordpageen_US
dc.identifier.volume16en_US
dc.identifier.issue2en_US
dc.identifier.spage91en_US
dc.identifier.epage97en_US
dc.identifier.isiWOS:000167039300008-
dc.publisher.placeUnited Kingdomen_US
dc.identifier.scopusauthoridDjurišić, AB=7004904830en_US
dc.identifier.scopusauthoridBundaleski, NK=6506808994en_US
dc.identifier.scopusauthoridLi, EH=7201410087en_US

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