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Article: Ni addition into Co ferrite-plated films

TitleNi addition into Co ferrite-plated films
Authors
Zhang, FKitamoto, YAbe, M
Issue Date2000
Citation
Funtai Oyobi Fummatsu Yakin/Journal Of The Japan Society Of Powder And Powder Metallurgy, 2000, v. 47 n. 2, p. 171-174 How to Cite?
AbstractThe present paper describes the effects of adding Ni2+ ions into Co ferrite by the spin-spray ferrite-plating method for perpendicular magnetic recording media. Surface roughness of the Co ferrite-plated films increased with decreasing their thickness due to grains as large as 100nm formed at the initial growth, though a thin recording layer below 50nm is required for high-density recording media with lower noise level. Adding Ni2+ ions into the films suppressed the formation of such large grains, and the surface of Co-Ni ferrite-plated films was composed of uniform grains of 40-50nm in size. As a result, the surface roughness was reduced from 5-6nm to 3-4nm for 45nm-thick films, and such improvement in the microstructure led to the reduction of media noise.
Persistent Identifierhttp://hdl.handle.net/10722/174789
ISSN
0532-8799
2020 SCImago Journal Rankings: 0.171
References
References in Scopus

 

DC FieldValueLanguage
dc.contributor.authorZhang, Fen_US
dc.contributor.authorKitamoto, Yen_US
dc.contributor.authorAbe, Men_US
dc.date.accessioned2012-11-26T08:47:27Z-
dc.date.available2012-11-26T08:47:27Z-
dc.date.issued2000en_US
dc.identifier.citationFuntai Oyobi Fummatsu Yakin/Journal Of The Japan Society Of Powder And Powder Metallurgy, 2000, v. 47 n. 2, p. 171-174en_US
dc.identifier.issn0532-8799en_US
dc.identifier.urihttp://hdl.handle.net/10722/174789-
dc.description.abstractThe present paper describes the effects of adding Ni2+ ions into Co ferrite by the spin-spray ferrite-plating method for perpendicular magnetic recording media. Surface roughness of the Co ferrite-plated films increased with decreasing their thickness due to grains as large as 100nm formed at the initial growth, though a thin recording layer below 50nm is required for high-density recording media with lower noise level. Adding Ni2+ ions into the films suppressed the formation of such large grains, and the surface of Co-Ni ferrite-plated films was composed of uniform grains of 40-50nm in size. As a result, the surface roughness was reduced from 5-6nm to 3-4nm for 45nm-thick films, and such improvement in the microstructure led to the reduction of media noise.en_US
dc.languageengen_US
dc.relation.ispartofFuntai Oyobi Fummatsu Yakin/Journal of the Japan Society of Powder and Powder Metallurgyen_US
dc.titleNi addition into Co ferrite-plated filmsen_US
dc.typeArticleen_US
dc.identifier.emailZhang, F: fuchun@hkucc.hku.hken_US
dc.identifier.authorityZhang, F=rp00840en_US
dc.description.naturelink_to_subscribed_fulltexten_US
dc.identifier.scopuseid_2-s2.0-0033893662en_US
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-0033893662&selection=ref&src=s&origin=recordpageen_US
dc.identifier.volume47en_US
dc.identifier.issue2en_US
dc.identifier.spage171en_US
dc.identifier.epage174en_US
dc.identifier.scopusauthoridZhang, F=14012468800en_US
dc.identifier.scopusauthoridKitamoto, Y=7006209500en_US
dc.identifier.scopusauthoridAbe, M=35399559100en_US
dc.identifier.issnl0532-8799-

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