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Article: CHROMIUM CONTAMINATION IN VPE InP FROM PHOTOCONDUCTIVITY SPECTRA.

TitleCHROMIUM CONTAMINATION IN VPE InP FROM PHOTOCONDUCTIVITY SPECTRA.
Authors
Issue Date1981
PublisherThe Institution of Engineering and Technology. The Journal's web site is located at http://www.ieedl.org/EL
Citation
Electronics Letters, 1981, v. 17 n. 5, p. 188-189 How to Cite?
AbstractA photoconductivity study has been made of nominally undoped VPE n-InP materials grown on semi-insulating InP:Fe substrates. The photoresponse spectra obtained indicate features characteristic of Cr deep acceptors. By comparing the magnitudes of the photoresponse with that of a back-doped InP:Cr reference sample, the concentration has been estimated at between 2 and 8 multiplied by 10**1**4 cm** minus **3.
Persistent Identifierhttp://hdl.handle.net/10722/174675
ISSN
2015 Impact Factor: 0.854
2015 SCImago Journal Rankings: 0.549

 

DC FieldValueLanguage
dc.contributor.authorFung, Sen_US
dc.contributor.authorNicholas, RJen_US
dc.contributor.authorDavison, AMen_US
dc.contributor.authorStradling, RAen_US
dc.date.accessioned2012-11-26T08:46:50Z-
dc.date.available2012-11-26T08:46:50Z-
dc.date.issued1981en_US
dc.identifier.citationElectronics Letters, 1981, v. 17 n. 5, p. 188-189en_US
dc.identifier.issn0013-5194en_US
dc.identifier.urihttp://hdl.handle.net/10722/174675-
dc.description.abstractA photoconductivity study has been made of nominally undoped VPE n-InP materials grown on semi-insulating InP:Fe substrates. The photoresponse spectra obtained indicate features characteristic of Cr deep acceptors. By comparing the magnitudes of the photoresponse with that of a back-doped InP:Cr reference sample, the concentration has been estimated at between 2 and 8 multiplied by 10**1**4 cm** minus **3.en_US
dc.languageengen_US
dc.publisherThe Institution of Engineering and Technology. The Journal's web site is located at http://www.ieedl.org/ELen_US
dc.relation.ispartofElectronics Lettersen_US
dc.titleCHROMIUM CONTAMINATION IN VPE InP FROM PHOTOCONDUCTIVITY SPECTRA.en_US
dc.typeArticleen_US
dc.identifier.emailFung, S: sfung@hku.hken_US
dc.identifier.authorityFung, S=rp00695en_US
dc.description.naturelink_to_subscribed_fulltexten_US
dc.identifier.scopuseid_2-s2.0-0019873165en_US
dc.identifier.volume17en_US
dc.identifier.issue5en_US
dc.identifier.spage188en_US
dc.identifier.epage189en_US
dc.publisher.placeUnited Kingdomen_US
dc.identifier.scopusauthoridFung, S=7201970040en_US
dc.identifier.scopusauthoridNicholas, RJ=7102569757en_US
dc.identifier.scopusauthoridDavison, AM=7201753776en_US
dc.identifier.scopusauthoridStradling, RA=7005186901en_US

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