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Article: Modeling the index of refraction of insulating solids with a modified Lorentz oscillator model

TitleModeling the index of refraction of insulating solids with a modified Lorentz oscillator model
Authors
Issue Date1998
PublisherOptical Society of America. The Journal's web site is located at http://ao.osa.org/journal/ao/about.cfm
Citation
Applied Optics, 1998, v. 37 n. 22, p. 5291-5297 How to Cite?
AbstractA modification of the Lorentz oscillator model for optical constants is proposed in an effort to achieve better agreement with experimental data while keeping the calculation simple. Improvement in agreement between theoretical and experimental data obtained with a variable line shape (frequency-dependent damping constant) over a wide spectral range is demonstrated through modeling the index of refraction of Si3N4 (1-24 eV), SiO (0.15-25 eV) and amorphous and crystalline SiO2 (0.15-25 eV). Model parameters are estimated by acceptance-probability-controlled simulated annealing. Excellent agreement between the modified model and the experimental data is obtained for both real and imaginary parts of the index of refraction. © 1998 Optical Society of America.
Persistent Identifierhttp://hdl.handle.net/10722/174658
ISSN
2010 Impact Factor: 1.707
ISI Accession Number ID
References

 

DC FieldValueLanguage
dc.contributor.authorDjurišić, ABen_US
dc.contributor.authorLi, HEen_US
dc.date.accessioned2012-11-26T08:46:45Z-
dc.date.available2012-11-26T08:46:45Z-
dc.date.issued1998en_US
dc.identifier.citationApplied Optics, 1998, v. 37 n. 22, p. 5291-5297en_US
dc.identifier.issn0003-6935en_US
dc.identifier.urihttp://hdl.handle.net/10722/174658-
dc.description.abstractA modification of the Lorentz oscillator model for optical constants is proposed in an effort to achieve better agreement with experimental data while keeping the calculation simple. Improvement in agreement between theoretical and experimental data obtained with a variable line shape (frequency-dependent damping constant) over a wide spectral range is demonstrated through modeling the index of refraction of Si3N4 (1-24 eV), SiO (0.15-25 eV) and amorphous and crystalline SiO2 (0.15-25 eV). Model parameters are estimated by acceptance-probability-controlled simulated annealing. Excellent agreement between the modified model and the experimental data is obtained for both real and imaginary parts of the index of refraction. © 1998 Optical Society of America.en_US
dc.languageengen_US
dc.publisherOptical Society of America. The Journal's web site is located at http://ao.osa.org/journal/ao/about.cfmen_US
dc.relation.ispartofApplied Opticsen_US
dc.rightsApplied Optics. Copyright © Optical Society of America.-
dc.titleModeling the index of refraction of insulating solids with a modified Lorentz oscillator modelen_US
dc.typeArticleen_US
dc.identifier.emailDjurišić, AB: dalek@hku.hken_US
dc.identifier.authorityDjurišić, AB=rp00690en_US
dc.description.naturelink_to_subscribed_fulltexten_US
dc.identifier.doi10.1364/AO.37.005291-
dc.identifier.pmid18286008-
dc.identifier.scopuseid_2-s2.0-0003662468en_US
dc.identifier.hkuros45570-
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-0003662468&selection=ref&src=s&origin=recordpageen_US
dc.identifier.volume37en_US
dc.identifier.issue22en_US
dc.identifier.spage5291en_US
dc.identifier.epage5297en_US
dc.identifier.isiWOS:000075107300035-
dc.publisher.placeUnited Statesen_US
dc.identifier.scopusauthoridDjurišić, AB=7004904830en_US
dc.identifier.scopusauthoridHerbert Li, E=6506152591en_US
dc.customcontrol.immutablejt 131018-

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