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Article: On the adoption of MC/DC and control-flow adequacy for a tight integration of program testing and statistical fault localization

TitleOn the adoption of MC/DC and control-flow adequacy for a tight integration of program testing and statistical fault localization
Authors
Issue Date2013
Citation
Information and Software Technology, 2013, v. 55 n. 5, p. 897-917 How to Cite?
Persistent Identifierhttp://hdl.handle.net/10722/174182
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorJiang, Ben_US
dc.contributor.authorZhai, Ken_US
dc.contributor.authorChan, WKen_US
dc.contributor.authorTse, THen_US
dc.contributor.authorZhang, Zen_US
dc.date.accessioned2012-11-16T03:38:40Z-
dc.date.available2012-11-16T03:38:40Z-
dc.date.issued2013en_US
dc.identifier.citationInformation and Software Technology, 2013, v. 55 n. 5, p. 897-917en_US
dc.identifier.urihttp://hdl.handle.net/10722/174182-
dc.languageengen_US
dc.relation.ispartofInformation and Software Technology (ISI impact factor 1.527)en_US
dc.titleOn the adoption of MC/DC and control-flow adequacy for a tight integration of program testing and statistical fault localizationen_US
dc.typeArticleen_US
dc.identifier.emailChan, WK: rickchan@hkucc.hku.hken_US
dc.identifier.emailTse, TH: thtse@cs.hku.hken_US
dc.identifier.emailZhang, Z: zhang4zy@hku.hken_US
dc.identifier.authorityTse, TH=rp00546en_US
dc.identifier.doi10.1016/j.infsof.2012.10.001-
dc.identifier.scopuseid_2-s2.0-84875215650-
dc.identifier.hkuros214782en_US
dc.identifier.spage897en_US
dc.identifier.epage917en_US
dc.identifier.isiWOS:000317327000008-

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