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Article: Nonlinear dynamic load models with recovery for voltage stability studies

TitleNonlinear dynamic load models with recovery for voltage stability studies
Authors
Issue Date1993
PublisherI E E E. The Journal's web site is located at http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=59
Citation
Ieee Transactions On Power Systems, 1993, v. 8 n. 1, p. 166-176 How to Cite?
AbstractMotivated by projects in Sweden on voltage stability analysis and associated load modelling, a simple dynamic load model is proposed which captures the usual nonlinear steady-state behaviour plus load recovery and overshoot. The parameters of the model can be related to physical devices depending on the time zone following a disturbance. Some simple, but seemingly important dynamic voltage stability analysis is developed based on the model.
Persistent Identifierhttp://hdl.handle.net/10722/169635
ISSN
2015 Impact Factor: 3.342
2015 SCImago Journal Rankings: 4.126
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorHill, David Jen_US
dc.date.accessioned2012-10-25T04:53:57Z-
dc.date.available2012-10-25T04:53:57Z-
dc.date.issued1993en_US
dc.identifier.citationIeee Transactions On Power Systems, 1993, v. 8 n. 1, p. 166-176en_US
dc.identifier.issn0885-8950en_US
dc.identifier.urihttp://hdl.handle.net/10722/169635-
dc.description.abstractMotivated by projects in Sweden on voltage stability analysis and associated load modelling, a simple dynamic load model is proposed which captures the usual nonlinear steady-state behaviour plus load recovery and overshoot. The parameters of the model can be related to physical devices depending on the time zone following a disturbance. Some simple, but seemingly important dynamic voltage stability analysis is developed based on the model.en_US
dc.languageengen_US
dc.publisherI E E E. The Journal's web site is located at http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=59en_US
dc.relation.ispartofIEEE Transactions on Power Systemsen_US
dc.titleNonlinear dynamic load models with recovery for voltage stability studiesen_US
dc.typeArticleen_US
dc.identifier.emailHill, David J:en_US
dc.identifier.authorityHill, David J=rp01669en_US
dc.description.naturelink_to_subscribed_fulltexten_US
dc.identifier.doi10.1109/59.221270en_US
dc.identifier.scopuseid_2-s2.0-0027543193en_US
dc.identifier.volume8en_US
dc.identifier.issue1en_US
dc.identifier.spage166en_US
dc.identifier.epage176en_US
dc.identifier.isiWOS:A1993KZ37700023-
dc.publisher.placeUnited Statesen_US
dc.identifier.scopusauthoridHill, David J=35398599500en_US

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