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Conference Paper: Order batching and picking in a synchronized zone order picking system

TitleOrder batching and picking in a synchronized zone order picking system
Authors
KeywordsApplied probability
Order batching
Order picking
Queueing
Analytical approximation
Issue Date2011
PublisherIEEE. The Journal's web site is located at http://ieeexplore.ieee.org/xpl/conhome.jsp?punumber=1001598
Citation
The IEEE International Conference on Industrial Engineering and Engineering Management (IEEM 2011), Singapore, 6-9 December 2011. In Proceedings of the IEEE IEEM, 2011, p. 156-160 How to Cite?
AbstractOrder picking has been considered as one of the most critical operations in warehouse. In this study, we propose an analytical approximation model based on probability and queueing network theory to analyze order batching and picking area zoning on the mean order throughput time in a synchronized zone picker-to-part order picking system. The resulting model can be easily applied in the design and selection process of order picking systems. © 2011 IEEE.
Persistent Identifierhttp://hdl.handle.net/10722/158883
ISBN
ISSN
References

 

DC FieldValueLanguage
dc.contributor.authorPan, Len_US
dc.contributor.authorHuang, JZen_US
dc.contributor.authorChu, SCKen_US
dc.date.accessioned2012-08-08T09:04:05Z-
dc.date.available2012-08-08T09:04:05Z-
dc.date.issued2011en_US
dc.identifier.citationThe IEEE International Conference on Industrial Engineering and Engineering Management (IEEM 2011), Singapore, 6-9 December 2011. In Proceedings of the IEEE IEEM, 2011, p. 156-160en_US
dc.identifier.isbn978-1-4577-0739-1-
dc.identifier.issn2157-3611en_US
dc.identifier.urihttp://hdl.handle.net/10722/158883-
dc.description.abstractOrder picking has been considered as one of the most critical operations in warehouse. In this study, we propose an analytical approximation model based on probability and queueing network theory to analyze order batching and picking area zoning on the mean order throughput time in a synchronized zone picker-to-part order picking system. The resulting model can be easily applied in the design and selection process of order picking systems. © 2011 IEEE.en_US
dc.languageengen_US
dc.publisherIEEE. The Journal's web site is located at http://ieeexplore.ieee.org/xpl/conhome.jsp?punumber=1001598-
dc.relation.ispartofIEEE International Conference on Industrial Engineering and Engineering Management Proceedingsen_US
dc.rightsIEEE International Conference on Industrial Engineering and Engineering Management Proceedings. Copyright © IEEE.-
dc.rights©2011 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.-
dc.rightsCreative Commons: Attribution 3.0 Hong Kong License-
dc.subjectApplied probabilityen_US
dc.subjectOrder batchingen_US
dc.subjectOrder pickingen_US
dc.subjectQueueingen_US
dc.subjectAnalytical approximation-
dc.titleOrder batching and picking in a synchronized zone order picking systemen_US
dc.typeConference_Paperen_US
dc.identifier.emailPan, L: lipan@hku.hken_US
dc.identifier.emailHuang, JZ: jhuang@eti.hku.hk-
dc.identifier.emailChu, SCK: schu@hku.hk-
dc.identifier.authorityChu, SCK=rp00685en_US
dc.description.naturepublished_or_final_versionen_US
dc.identifier.doi10.1109/IEEM.2011.6117898en_US
dc.identifier.scopuseid_2-s2.0-84863048500-
dc.identifier.hkuros201370-
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-84856520285&selection=ref&src=s&origin=recordpageen_US
dc.identifier.spage156en_US
dc.identifier.epage160en_US
dc.publisher.placeUnited States-
dc.description.otherThe IEEE International Conference on Industrial Engineering and Engineering Management (IEEM 2011), Singapore, 6-9 December 2011. In Proceedings of the IEEE IEEM, 2011, p. 156-160-
dc.identifier.scopusauthoridChu, SCK=7403619384en_US
dc.identifier.scopusauthoridHuang, JZ=54948842100en_US
dc.identifier.scopusauthoridPan, L=35749044800en_US

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