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Conference Paper: Simulations of pulse signals with X-parameters

TitleSimulations of pulse signals with X-parameters
Authors
KeywordsNonlinearity
Polyharmonic distortion
Pulse signal
X-parameters
Digital CMOS
Issue Date2011
PublisherIEEE. The Journal's web site is located at http://ieeexplore.ieee.org/xpl/conhome.jsp?punumber=1000236
Citation
The IEEE 20th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS 2011), San Jose, CA., 23-26 October 2011. In Proceedings of the IEEE 20th EPEPS, 2011, p. 129-132 How to Cite?
AbstractNonlinearity is becoming increasingly important to IC technologies. From the PHD formalism, X-parameter models provide an accurate frequency-domain method under large-signal operating points to characterize their nonlinear behaviors. In this work, X-parameter models are investigated to handle time-domain pulse signals which is critical to IC signal integrity but was not studied before. Two representative circuits, an analog LNA and a digital CMOS buffer, were employed to characterize the X-parameter performance. The results obtained in this paper provide the first hand data for pulse signal responses of X-parameters in signal integrity modelings. © 2011 IEEE.
Persistent Identifierhttp://hdl.handle.net/10722/158768
ISBN
References

 

DC FieldValueLanguage
dc.contributor.authorHuang, NKHen_US
dc.contributor.authorJiang, Len_US
dc.date.accessioned2012-08-08T09:01:14Z-
dc.date.available2012-08-08T09:01:14Z-
dc.date.issued2011en_US
dc.identifier.citationThe IEEE 20th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS 2011), San Jose, CA., 23-26 October 2011. In Proceedings of the IEEE 20th EPEPS, 2011, p. 129-132en_US
dc.identifier.isbn978-1-4244-9401-9-
dc.identifier.urihttp://hdl.handle.net/10722/158768-
dc.description.abstractNonlinearity is becoming increasingly important to IC technologies. From the PHD formalism, X-parameter models provide an accurate frequency-domain method under large-signal operating points to characterize their nonlinear behaviors. In this work, X-parameter models are investigated to handle time-domain pulse signals which is critical to IC signal integrity but was not studied before. Two representative circuits, an analog LNA and a digital CMOS buffer, were employed to characterize the X-parameter performance. The results obtained in this paper provide the first hand data for pulse signal responses of X-parameters in signal integrity modelings. © 2011 IEEE.en_US
dc.languageengen_US
dc.publisherIEEE. The Journal's web site is located at http://ieeexplore.ieee.org/xpl/conhome.jsp?punumber=1000236-
dc.relation.ispartofIEEE Topical Meeting on Electrical Performance of Electronic Packaging Proceedingsen_US
dc.rightsIEEE Topical Meeting on Electrical Performance of Electronic Packaging Proceedings. Copyright © IEEE.-
dc.rights©2011 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.-
dc.rightsCreative Commons: Attribution 3.0 Hong Kong License-
dc.subjectNonlinearityen_US
dc.subjectPolyharmonic distortionen_US
dc.subjectPulse signalen_US
dc.subjectX-parametersen_US
dc.subjectDigital CMOS-
dc.titleSimulations of pulse signals with X-parametersen_US
dc.typeConference_Paperen_US
dc.identifier.emailHuang, NKH: nkhh@hku.hken_US
dc.identifier.emailJiang, L: jianglj@hku.hk-
dc.identifier.authorityJiang, L=rp01338en_US
dc.description.naturepublished_or_final_versionen_US
dc.identifier.doi10.1109/EPEPS.2011.6100206en_US
dc.identifier.scopuseid_2-s2.0-84855398467en_US
dc.identifier.hkuros210826-
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-84855398467&selection=ref&src=s&origin=recordpageen_US
dc.identifier.spage129en_US
dc.identifier.epage132en_US
dc.publisher.placeUnited States-
dc.description.otherThe IEEE 20th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS 2011), San Jose, CA., 23-26 October 2011. In Proceedings of the IEEE 20th EPEPS, 2011, p. 129-132-
dc.identifier.scopusauthoridJiang, L=36077777200en_US
dc.identifier.scopusauthoridHuang, NKH=14621606900en_US

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