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Conference Paper: Relationship of quality factor and hollow winding structure of Coreless Printed Spiral Winding (CPSW) inductor

TitleRelationship of quality factor and hollow winding structure of Coreless Printed Spiral Winding (CPSW) inductor
Authors
Issue Date2010
Citation
Conference Proceedings - Ieee Applied Power Electronics Conference And Exposition - Apec, 2010, p. 86-91 How to Cite?
AbstractThe principle of using hollow spiral winding is not novel, but the study on this topic is far from complete. In this paper, how hollow the central region of the Coreless Printed Spiral Winding (CPSW) inductor should be in order to achieve the maximal quality factor value Qmax is explored. A new parameter, namely the ratio of the inner hollow radius and the outer winding radius τ = Rin / Rout, is proposed as an indicator for optimization and used to quantify how hollow a spiral winding is. With the aid of Finite Element Analysis (FEA), the relationship between τ and Q max, which depends on the operating frequency and the dimensional parameters of CPSW inductor, is established. For a specific operating frequency, it is discovered that if the conductor width is comparable with the skin depth, or the conductors are placed relatively far away from each others, the hollow design of the CPSW inductor has little improvement on Q but reduces the inductance. On the contrary, if the conductor width is much larger than the skin depth and the conductors are placed relatively close, the hollow spiral design is recommended. The optimal range of τ with which the Qmax can be achieved is found to be around 0.45 to 0.55. ©2010 IEEE.
Persistent Identifierhttp://hdl.handle.net/10722/158635
ISI Accession Number ID
References

 

DC FieldValueLanguage
dc.contributor.authorSu, YPen_US
dc.contributor.authorLiu, Xen_US
dc.contributor.authorLee, CKen_US
dc.contributor.authorHui, SYRen_US
dc.date.accessioned2012-08-08T09:00:35Z-
dc.date.available2012-08-08T09:00:35Z-
dc.date.issued2010en_US
dc.identifier.citationConference Proceedings - Ieee Applied Power Electronics Conference And Exposition - Apec, 2010, p. 86-91en_US
dc.identifier.urihttp://hdl.handle.net/10722/158635-
dc.description.abstractThe principle of using hollow spiral winding is not novel, but the study on this topic is far from complete. In this paper, how hollow the central region of the Coreless Printed Spiral Winding (CPSW) inductor should be in order to achieve the maximal quality factor value Qmax is explored. A new parameter, namely the ratio of the inner hollow radius and the outer winding radius τ = Rin / Rout, is proposed as an indicator for optimization and used to quantify how hollow a spiral winding is. With the aid of Finite Element Analysis (FEA), the relationship between τ and Q max, which depends on the operating frequency and the dimensional parameters of CPSW inductor, is established. For a specific operating frequency, it is discovered that if the conductor width is comparable with the skin depth, or the conductors are placed relatively far away from each others, the hollow design of the CPSW inductor has little improvement on Q but reduces the inductance. On the contrary, if the conductor width is much larger than the skin depth and the conductors are placed relatively close, the hollow spiral design is recommended. The optimal range of τ with which the Qmax can be achieved is found to be around 0.45 to 0.55. ©2010 IEEE.en_US
dc.languageengen_US
dc.relation.ispartofConference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APECen_US
dc.titleRelationship of quality factor and hollow winding structure of Coreless Printed Spiral Winding (CPSW) inductoren_US
dc.typeConference_Paperen_US
dc.identifier.emailHui, SYR:ronhui@eee.hku.hken_US
dc.identifier.authorityHui, SYR=rp01510en_US
dc.description.naturelink_to_subscribed_fulltexten_US
dc.identifier.doi10.1109/APEC.2010.5433690en_US
dc.identifier.scopuseid_2-s2.0-77952163935en_US
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-77952163935&selection=ref&src=s&origin=recordpageen_US
dc.identifier.spage86en_US
dc.identifier.epage91en_US
dc.identifier.isiWOS:000278142300015-
dc.identifier.scopusauthoridSu, YP=24468926200en_US
dc.identifier.scopusauthoridLiu, X=27171587300en_US
dc.identifier.scopusauthoridLee, CK=24468281700en_US
dc.identifier.scopusauthoridHui, SYR=7202831744en_US

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