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Conference Paper: Influence of layer thickness to the emission spectra in microcavity organic light emitting diodes

TitleInfluence of layer thickness to the emission spectra in microcavity organic light emitting diodes
Authors
KeywordsMicrocavity
OLED
Issue Date2005
Citation
Conference On Optoelectronic And Microelectronic Materials And Devices, Proceedings, Commad, 2005, p. 347-350 How to Cite?
Abstract
Microcavity organic light emitting diodes (OLEDs) have attracted great attention because they can reduce the width of emission spectra from organic materials, enhance brightness and achieve multipeak emission from the same material. In this work, we have fabricated microcavity OLEDs with widely used organic materials, such as N,N′-di(naphthalene-1-yl)-N,N′- diphenylbenzidine (NPB) as a hole transport layer and tris (8-hydroxyquinoline) (Alq) as emitting and electron transporting layer. These organic materials are sandwiched either between two thick silver mirrors or one thin copper and one thick silver mirrors. The influence of total cavity length (from 164 nm to 243nm) and the cavity Q-factor to the emission behavior has been investigated. In all cases, an OLED without bottom mirror, i.e. with the organic materials sandwiched between indium tin oxide and a thick silver mirror, has been fabricated for comparison. We have characterized the devices with photoluminescence, electroluminescence, and reflectance measurements. Multiple peaks have been observed for some devices at larger viewing angles. © 2005 IEEE.
Persistent Identifierhttp://hdl.handle.net/10722/158525
References

 

Author Affiliations
  1. University of Queensland
  2. The University of Hong Kong
  3. Hong Kong Baptist University
DC FieldValueLanguage
dc.contributor.authorKwong, CYen_HK
dc.contributor.authorDjurišić, ABen_HK
dc.contributor.authorCheung, CHen_HK
dc.contributor.authorChan, Jen_HK
dc.contributor.authorRakić, ADen_HK
dc.contributor.authorTam, HLen_HK
dc.contributor.authorCheah, KWen_HK
dc.contributor.authorLiu, ZTen_HK
dc.contributor.authorChan, WKen_HK
dc.contributor.authorChui, PCen_HK
dc.date.accessioned2012-08-08T09:00:05Z-
dc.date.available2012-08-08T09:00:05Z-
dc.date.issued2005en_HK
dc.identifier.citationConference On Optoelectronic And Microelectronic Materials And Devices, Proceedings, Commad, 2005, p. 347-350en_US
dc.identifier.urihttp://hdl.handle.net/10722/158525-
dc.description.abstractMicrocavity organic light emitting diodes (OLEDs) have attracted great attention because they can reduce the width of emission spectra from organic materials, enhance brightness and achieve multipeak emission from the same material. In this work, we have fabricated microcavity OLEDs with widely used organic materials, such as N,N′-di(naphthalene-1-yl)-N,N′- diphenylbenzidine (NPB) as a hole transport layer and tris (8-hydroxyquinoline) (Alq) as emitting and electron transporting layer. These organic materials are sandwiched either between two thick silver mirrors or one thin copper and one thick silver mirrors. The influence of total cavity length (from 164 nm to 243nm) and the cavity Q-factor to the emission behavior has been investigated. In all cases, an OLED without bottom mirror, i.e. with the organic materials sandwiched between indium tin oxide and a thick silver mirror, has been fabricated for comparison. We have characterized the devices with photoluminescence, electroluminescence, and reflectance measurements. Multiple peaks have been observed for some devices at larger viewing angles. © 2005 IEEE.en_HK
dc.languageengen_US
dc.relation.ispartofConference on Optoelectronic and Microelectronic Materials and Devices, Proceedings, COMMADen_HK
dc.subjectMicrocavityen_HK
dc.subjectOLEDen_HK
dc.titleInfluence of layer thickness to the emission spectra in microcavity organic light emitting diodesen_HK
dc.typeConference_Paperen_HK
dc.identifier.emailDjurišić, AB: dalek@hku.hken_HK
dc.identifier.emailChan, WK: waichan@hku.hken_HK
dc.identifier.emailChui, PC: pcchui@hkucc.hku.hken_HK
dc.identifier.authorityDjurišić, AB=rp00690en_HK
dc.identifier.authorityChan, WK=rp00667en_HK
dc.identifier.authorityChui, PC=rp00114en_HK
dc.description.naturelink_to_subscribed_fulltexten_US
dc.identifier.doi10.1109/COMMAD.2004.1577562en_HK
dc.identifier.scopuseid_2-s2.0-46149114367en_HK
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-46149114367&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.spage347en_HK
dc.identifier.epage350en_HK
dc.identifier.scopusauthoridKwong, CY=35917741900en_HK
dc.identifier.scopusauthoridDjurišić, AB=7004904830en_HK
dc.identifier.scopusauthoridCheung, CH=8618960900en_HK
dc.identifier.scopusauthoridChan, J=9234340000en_HK
dc.identifier.scopusauthoridRakić, AD=35618124100en_HK
dc.identifier.scopusauthoridTam, HL=7101835048en_HK
dc.identifier.scopusauthoridCheah, KW=7102792922en_HK
dc.identifier.scopusauthoridLiu, ZT=23389753500en_HK
dc.identifier.scopusauthoridChan, WK=13310083000en_HK
dc.identifier.scopusauthoridChui, PC=13309913400en_HK

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